{
  "abstract": "Atomic-scale phase imaging is central to resolving defects, interfaces, and weakly scattering atoms that govern the behavior of nanoscale materials. Electron ptychography delivers sub-ångström phase sensitivity but remains an offline technique, because its iterative reconstruction is computationally expensive and sensitive to experimental calibration, preventing live use during data acquisition. Here, a ptychography-supervised local inference framework is presented that converts four-dimensional scanning transmission electron microscopy (4D-STEM) into an acquisition-compatible phase-imaging workflow. Physics-constrained reference phase maps reconstructed from a single experimental AuPd dataset serve as teacher labels for a compact model that predicts local phase patches directly from diffraction measurements, without explicit probe input or online iterative optimization. Full-field images are assembled by deterministic overlap stitching. The workflow reaches an online latency of about 0.27 ms per probe position and a throughput of about 20,000 positions per second, an approximately 1,000-fold speed-up over GPU-accelerated ePIE, while preserving atomic-scale lattice contrast and reciprocal-space fidelity. Without fine-tuning, the same model transfers across materials (WS2), defocus conditions (high-entropy alloy nanoparticles), and instruments (hBN at 300 kV). The approach amortizes ptychographic redundancy into a fast, generalizable workflow that enables real-time atomic-scale phase imaging for materials microscopy.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2609.25684",
  "author_total": 7,
  "authors": [
    {
      "name": "H. Yue"
    },
    {
      "name": "C. -C. Chen"
    },
    {
      "name": "C. -N. Hsiao"
    },
    {
      "name": "J. Cheng"
    },
    {
      "name": "Y. Liu"
    },
    {
      "name": "X. Z. Liao"
    },
    {
      "name": "Steve F. Shu"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/0g2qh8kbrhjhc.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2609.25684",
  "fulltext_url": null,
  "id": "0g2qh8kbrhjhc",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2609.25684",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mtrl-sci"
    ],
    [
      "arxiv",
      "cs.CV"
    ],
    [
      "openalex",
      "1315|Advanced Electron Microscopy Techniques and Applications"
    ]
  ],
  "openalex": "W7214126126",
  "pdf_url": "https://arxiv.org/pdf/2609.25684",
  "pmcid": null,
  "pmid": null,
  "published": "2026-09-22",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/0g2qh8kbrhjhc.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:23:39Z",
      "native_id": "2609.25684",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2609.25684"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mtrl-sci",
      "subfield": "condensed-matter"
    }
  ],
  "title": "Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning",
  "title_text": "Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning",
  "type": "preprint",
  "updated_at": "2026-10-30T12:23:39Z",
  "url": "https://research.draconitic.com/paper/0g2qh8kbrhjhc",
  "venue": "arXiv",
  "versions": []
}