{
  "abstract": "Accurate lens surface metrology is essential to determine the manufactured geometry of refractive optical elements and their deviation from the specified design. We demonstrate a transmission metrology method that reconstructs refractive lens surfaces from the displacement of a wavelet-noise-patterned mask. Lens-induced distortion is represented by a dense displacement field. A differentiable ray tracer fits the lens geometry using a calibrated near-telecentric camera model with an effective finite ray origin. We validate the method on commercial lenses. The recovered geometries agree with nominal specifications, and the plano-aspheric reconstruction is compared with chromatic confocal profilometry.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.17515",
  "author_total": 2,
  "authors": [
    {
      "name": "Hector A. Jimenez-Romero"
    },
    {
      "name": "Wolfgang Heidrich"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/0hknvjw4ahybc.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.17515",
  "fulltext_url": null,
  "id": "0hknvjw4ahybc",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.17515",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "physics.app-ph"
    ],
    [
      "arxiv",
      "physics.ins-det"
    ],
    [
      "arxiv",
      "physics.optics"
    ],
    [
      "openalex",
      "1707|Optical measurement and interference techniques"
    ]
  ],
  "openalex": "W7221817878",
  "pdf_url": "https://arxiv.org/pdf/2610.17515",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-13",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/0hknvjw4ahybc.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:29:11Z",
      "native_id": "2610.17515",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.17515"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:physics.app-ph",
      "subfield": "applied-instrumentation"
    },
    {
      "field": "physics",
      "origin": "arxiv:physics.optics",
      "subfield": "optics-photonics"
    }
  ],
  "title": "Non-contact lens metrology from optical flow and differentiable ray tracing",
  "title_text": "Non-contact lens metrology from optical flow and differentiable ray tracing",
  "type": "preprint",
  "updated_at": "2026-10-30T12:29:11Z",
  "url": "https://research.draconitic.com/paper/0hknvjw4ahybc",
  "venue": "arXiv",
  "versions": []
}