{
  "abstract": "Convergent beam electron diffraction (CBED), recently demonstrated on two-dimensional (2D) materials, offers a number of interesting applications such as imaging atomic in- and out-of plane shifts, interlayer distances, and individual adsorbates. In this study, we show how CBED allows for atomic-precision imaging of individual defects in 2D materials using one single-shot intensity measurement. In combination with structural calculations using density functional theory, we present simulated CBED patterns for various defects in graphene, each of which exhibits a unique fingerprint distribution. We also show how atomic positions, including the individual atomic defects in graphene, can be reconstructed by iterative phase retrieval from a single CBED pattern.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": "Journal reference: Phys. Rev. B 105, 184113, 2022",
  "arxiv": "2610.21542",
  "author_total": 3,
  "authors": [
    {
      "name": "Tatiana Latychevskaia"
    },
    {
      "name": "Pengru Huang"
    },
    {
      "name": "Kostya S. Novoselov"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/0v2h108wz7bch.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.21542",
  "fulltext_url": null,
  "id": "0v2h108wz7bch",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.21542",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mes-hall"
    ],
    [
      "arxiv",
      "physics.comp-ph"
    ],
    [
      "arxiv",
      "physics.optics"
    ]
  ],
  "openalex": null,
  "pdf_url": "https://arxiv.org/pdf/2610.21542",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-15",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/0v2h108wz7bch.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:29:50Z",
      "native_id": "2610.21542",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.21542"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:physics.comp-ph",
      "subfield": "computational"
    },
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mes-hall",
      "subfield": "condensed-matter"
    },
    {
      "field": "physics",
      "origin": "arxiv:physics.optics",
      "subfield": "optics-photonics"
    }
  ],
  "title": "Imaging defects in two-dimensional crystals by convergent beam electron diffraction",
  "title_text": "Imaging defects in two-dimensional crystals by convergent beam electron diffraction",
  "type": "preprint",
  "updated_at": "2026-10-30T12:29:50Z",
  "url": "https://research.draconitic.com/paper/0v2h108wz7bch",
  "venue": "arXiv",
  "versions": [
    {
      "doi": "10.1103/physrevb.105.184113",
      "pid": null,
      "relation": "published-as",
      "title": null,
      "venue": null
    }
  ]
}