{
  "abstract": "Process-induced warpage, ceramic stress and solder strain limit the reliability of insulated-gate bipolar transistor (IGBT) modules on direct-bonded copper (DBC) substrates. Surrogate-assisted design studies train regression models on finite-element analysis (FEA) databases, but rarely check the optimized designs against new FEA or report how surrogate error interacts with the optimizer. This paper builds and evaluates an open pipeline: an open-source process finite-element model, surrogates tuned by Simplified Swarm Optimization (SSO), multi-objective design search, FEA confirmation of selected designs and confirmation-driven infill. The model starts at the second reflow and reproduces measured warpage within 18.2%, 33.6% and 15.3% at the reflow, housing and molding stages without fitted parameters. On a balanced 60-design database, all stochastic tuners reach the same test accuracy, outperform the published grid on cross-validated performance for every output but generalize better only for warpage; the cross-validated ranking of tuners does not transfer to the test set. With equal result reporting, multi-objective SSO and the non-dominated sorting genetic algorithm II give comparable Pareto fronts; a corrected multi-objective particle swarm optimizer trails both. FEA confirmation shows that warpage predictions hold (mean absolute error 0.5%), whereas at the design-space bounds reached by the optimizers the ceramic-stress surrogate is optimistic by up to 26%. Two confirmation-driven infill rounds reduce this error to 1-10% and halve the out-of-sample error; no confirmed design improves on the database in ceramic stress. Ceramic-stress results are indicative, as the metric is mesh-sensitive at production resolution. The model, database, scripts and pre-registered and post-registration results are released.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.07412",
  "author_total": 1,
  "authors": [
    {
      "name": "Wei-Chang Yeh"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/0vwder05x36ns.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.07412",
  "fulltext_url": null,
  "id": "0vwder05x36ns",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.07412",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cs.CE"
    ],
    [
      "arxiv",
      "cs.NE"
    ],
    [
      "arxiv",
      "math.OC"
    ],
    [
      "openalex",
      "1703|Advanced Multi-Objective Optimization Algorithms"
    ]
  ],
  "openalex": "W7220936056",
  "pdf_url": "https://arxiv.org/pdf/2610.07412",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-05",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/0vwder05x36ns.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:27:26Z",
      "native_id": "2610.07412",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.07412"
    }
  ],
  "subjects": [
    {
      "field": "mathematics",
      "origin": "arxiv:math.OC",
      "subfield": "optimisation-control"
    }
  ],
  "title": "Simplified Swarm Optimization for Surrogate-Assisted Reliability Design of Insulated-Gate Bipolar Transistor Power Modules Using an Open-Source Process Finite-Element Model",
  "title_text": "Simplified Swarm Optimization for Surrogate-Assisted Reliability Design of Insulated-Gate Bipolar Transistor Power Modules Using an Open-Source Process Finite-Element Model",
  "type": "preprint",
  "updated_at": "2026-10-30T12:27:26Z",
  "url": "https://research.draconitic.com/paper/0vwder05x36ns",
  "venue": "arXiv",
  "versions": []
}