{
  "abstract": "Scanning electron microscopy (SEM) image classification is increasingly used to organize large microscopy archives, but high predictive accuracy alone does not establish that a model is scientifically reliable. Duplicate images, class imbalance, acquisition annotations, poorly calibrated confidence, and post hoc use of test data can all make performance appear stronger than it is. This study develops a leakage-controlled and reliability oriented workflow for ten-class SEM morphology classification using the public NFFA-EUROPE 100% SEM Dataset v2.0. The 21,169 source images were audited before modelling. Full-file MD5 screening removed 332 exact duplicates,while a perceptual-hash/structural-similarity pipeline identified 92 high-confidence near duplicate groups and removed 95 additional redundant images, producing a final modelling cohort of 20,742 images. A single stratified 70/15/15 train/validation/test split was then frozen for all experiments. Three model families were evaluated under this protocol: a1,041-feature hand crafted image descriptor with classical machine learning, a convolutional neural network trained from scratch,and an ImageNet-pretrained ResNet-18. On the held-out test set, the selected ResNet-18 achieved 0.942802 accuracy, 0.930980 balanced accuracy,and 0.931633 macro-F1, compared with 0.7789/0.6713/0.6890 for the classical baseline and 0.7947/0.8421/0.7425 for the scratch CNN.Validation-fitted temperature scaling reduced test expected calibration error from 0.018974 to 0.011369 without changing predicted classes. Grad-CAM provided coarse spatial checks of model attention, while a controlled chromatic-annotation-region perturbation experiment showed a larger mean absolute class-probability change than equal-area translated controls (0.032554 vs 0.002420; Wilcoxon p = 1.07 x 10^-26), but only 4 of 172 targeted images changed predicted class. Selective prediction further increased retained-image accuracy to 0.980007 at approximately 90% coverage while rejecting 68.54% of all test errors. Together, these results support a predominantly morphology-driven transfer model with measurable localized artifact sensitivity and show how dataset integrity, calibration, perturbation analysis, and confidence-based review can complement headline accuracy in materials microscopy.",
  "abstract_shown": true,
  "affiliations": [
    "Department of Industrial Chemistry",
    "Enugu State University of Science and Technology (ESUT"
  ],
  "article_type": null,
  "arxiv": null,
  "author_total": 1,
  "authors": [
    {
      "affs": [
        0,
        1
      ],
      "name": "Dennis Obinna Orji",
      "orcid": "0009-0009-1674-0883"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/10ea789wrtsdz.bib",
  "cited_by": 0,
  "doi": "10.26434/chemrxiv.15008876/v1",
  "fulltext_url": null,
  "id": "10ea789wrtsdz",
  "issns": [],
  "landing_url": "https://chemrxiv.org/doi/full/10.26434/chemrxiv.15008876/v1",
  "language": null,
  "licence": "CC-BY",
  "licence_label": "CC BY",
  "licence_source": "journal",
  "licence_url": "https://creativecommons.org/licenses/by/4.0/",
  "metadata_licence": null,
  "native_subjects": [
    [
      "openalex",
      "1707|Advanced Neural Network Applications"
    ]
  ],
  "openalex": "W7213356372",
  "pdf_url": null,
  "pmcid": null,
  "pmid": null,
  "published": "2026-09-15",
  "publisher": "American Chemical Society (ACS)",
  "ris": "https://research.draconitic.com/paper/10ea789wrtsdz.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:17:19Z",
      "native_id": "10.26434/chemrxiv.15008876",
      "source": "chemrxiv",
      "url": "https://chemrxiv.org/doi/full/10.26434/chemrxiv.15008876/v1"
    }
  ],
  "subjects": [
    {
      "field": "chemistry",
      "origin": "source:chemrxiv",
      "subfield": "general"
    }
  ],
  "title": "Intelligent Microscopy for Materials: Leakage-Controlled SEM Morphology Classification with Calibration, Explainability, and Artifact Perturbation",
  "title_text": "Intelligent Microscopy for Materials: Leakage-Controlled SEM Morphology Classification with Calibration, Explainability, and Artifact Perturbation",
  "type": "preprint",
  "updated_at": "2026-10-30T12:17:19Z",
  "url": "https://research.draconitic.com/paper/10ea789wrtsdz",
  "venue": "ChemRxiv",
  "versions": []
}