{
  "abstract": "Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendellösung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major challenge. Here, using a non-etching sub-micron fabrication technique, we demonstrate silicon triple-Laue interferometers with equal-blade-thicknesses of 110 $μ$m and 350 $μ$m, operated with both neutrons and X-rays. These devices are the thinnest PCIs realized to date, enabling a factor-of-six reduction in dynamical-diffraction beam spreading for improved phase-contrast imaging, while reaching the single pendellösung length regime in which crystal thickness provides an experimentally accessible control parameter for engineered quantum-optical beam splitting of plane-wave inputs. These results motivate multi-blade PCI designs utilizing identical half-pendellösung crystal lamellae that are proposed for neutron spin--orbit and electric dipole moment measurements.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2609.24709",
  "author_total": 15,
  "authors": [
    {
      "name": "Owen Lailey"
    },
    {
      "name": "Alexandre Boutot"
    },
    {
      "name": "David G. Cory"
    },
    {
      "name": "Joseph P. Cotter"
    },
    {
      "name": "Vishal Dhamgaye"
    },
    {
      "name": "Tao Hong"
    },
    {
      "name": "Michael G. Huber"
    },
    {
      "name": "Young-June Kim"
    },
    {
      "name": "Winfried Kockelmann"
    },
    {
      "name": "Jeremy W. Paster"
    },
    {
      "name": "Dusan Sarenac"
    },
    {
      "name": "Kawal Sawhney"
    },
    {
      "name": "Naume Shentevski"
    },
    {
      "name": "Ivar Taminiau"
    },
    {
      "name": "Dmitry A. Pushin"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/178vrh0nqerww.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2609.24709",
  "fulltext_url": null,
  "id": "178vrh0nqerww",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2609.24709",
  "language": null,
  "licence": "CC-BY-4.0",
  "licence_label": "CC BY 4.0",
  "licence_source": "article",
  "licence_url": "http://creativecommons.org/licenses/by/4.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "physics.app-ph"
    ],
    [
      "arxiv",
      "physics.optics"
    ],
    [
      "arxiv",
      "quant-ph"
    ],
    [
      "openalex",
      "3108|Nuclear Physics and Applications"
    ]
  ],
  "openalex": "W7214041824",
  "pdf_url": "https://arxiv.org/pdf/2609.24709",
  "pmcid": null,
  "pmid": null,
  "published": "2026-09-21",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/178vrh0nqerww.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:23:19Z",
      "native_id": "2609.24709",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2609.24709"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:physics.app-ph",
      "subfield": "applied-instrumentation"
    },
    {
      "field": "physics",
      "origin": "arxiv:physics.optics",
      "subfield": "optics-photonics"
    },
    {
      "field": "physics",
      "origin": "arxiv:quant-ph",
      "subfield": "quantum"
    }
  ],
  "title": "Pendellösung length-scale neutron and X-ray interferometry",
  "title_text": "Pendellösung length-scale neutron and X-ray interferometry",
  "type": "preprint",
  "updated_at": "2026-10-30T12:23:19Z",
  "url": "https://research.draconitic.com/paper/178vrh0nqerww",
  "venue": "arXiv",
  "versions": []
}