{
  "abstract": "Skipper Charge-Coupled Devices (Skipper-CCDs) are detectors with sub-electron resolution, allowing them to play a critical role in rare-event searches. A major challenge in experiments using these detectors is understanding and mitigating low-energy backgrounds which impact the single-electron rate. One potential component of the single-electron rate could arise from single-electron charge traps caused by lattice defects. In this work we use a new in-situ technique for generating uniform charge known as ``pixel-pumping'' across the CCD to study single-electron traps in a SENSEI sensor placed underground in the MINOS cavern at Fermilab, which enables sensitivity to long-lived traps with emission times $>10^3$ seconds, a regime that was previously not accessible. We fully characterize 1787 traps and use this information to estimate their contribution to the single-electron background in SENSEI. Through simulation, we find the characterized population of traps does not significantly impact the single-electron rate. We further identify the energies and cross-sections for traps to which this analysis is sensitive, and compare this with the values that could impact the single-electron rate. This analysis probes a large fraction of this region. However, we also see that a sufficiently numerous hidden population could contribute significantly to the single-electron rate, and new measurement techniques will have to be devised in order to fully rule out this population.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.22418",
  "author_total": 12,
  "authors": [
    {
      "name": "Ansh Desai"
    },
    {
      "name": "Ana M. Botti"
    },
    {
      "name": "Brenda A. Cervantes-Vergara"
    },
    {
      "name": "Rouven Essig"
    },
    {
      "name": "Stephen E. Holland"
    },
    {
      "name": "Ian Lawson"
    },
    {
      "name": "Steffon Luoma"
    },
    {
      "name": "Santiago Perez"
    },
    {
      "name": "Javier Tiffenberg"
    },
    {
      "name": "Sho Uemura"
    },
    {
      "name": "Yikai Wu"
    },
    {
      "name": "Tien-Tien Yu"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/2yzyvxnbksdrx.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.22418",
  "fulltext_url": null,
  "id": "2yzyvxnbksdrx",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.22418",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "astro-ph.IM"
    ],
    [
      "arxiv",
      "hep-ex"
    ],
    [
      "arxiv",
      "physics.ins-det"
    ],
    [
      "openalex",
      "3106|Particle Detector Development and Performance"
    ]
  ],
  "openalex": "W7222975400",
  "pdf_url": "https://arxiv.org/pdf/2610.22418",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-15",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/2yzyvxnbksdrx.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:30:32Z",
      "native_id": "2610.22418",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.22418"
    }
  ],
  "subjects": [
    {
      "field": "astronomy",
      "origin": "arxiv:astro-ph.IM",
      "subfield": "instrumentation-methods"
    },
    {
      "field": "physics",
      "origin": "arxiv:physics.ins-det",
      "subfield": "applied-instrumentation"
    },
    {
      "field": "physics",
      "origin": "arxiv:hep-ex",
      "subfield": "high-energy"
    }
  ],
  "title": "Long-Lived Charge Trap Characterization for Rare-Event Searches with Skipper-CCDs",
  "title_text": "Long-Lived Charge Trap Characterization for Rare-Event Searches with Skipper-CCDs",
  "type": "preprint",
  "updated_at": "2026-10-30T12:33:28Z",
  "url": "https://research.draconitic.com/paper/2yzyvxnbksdrx",
  "venue": "arXiv",
  "versions": []
}