{
  "abstract": "Ni films with thicknesses of 312 and 1011\\,Å were grown on Si(111) by dc magnetron sputtering at room temperature and studied by atomic force microscopy, grazing-incidence X-ray diffraction, X-ray reflectivity, magnetometry and angle-dependent ferromagnetic resonance. Both films are polycrystalline fcc Ni with smooth surfaces, a bulk-like (111) lattice spacing and a saturation magnetization of ${\\approx}480$\\,emu\\,cm$^{-3}$, and both are magnetized in plane. The angular dependence of the resonance field, from the film plane to the film normal, is described by a uniaxial anisotropy model with first- and second-order terms. From this model, $g = 2.160\\pm0.005$ and $2.101\\pm0.014$ and effective perpendicular anisotropies of $(6.0\\pm0.4)\\times10^{5}$ and $(4.5\\pm0.6)\\times10^{5}$\\,erg\\,cm$^{-3}$ were obtained for the thinner and thicker film, respectively. The conventional analysis of only the in-plane and perpendicular resonances gives $g$-factors that are lower by 0.02--0.04. The perpendicular linewidths give upper limits for the Gilbert damping of $α\\le 0.030$ and $\\le 0.038$.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.33637",
  "author_total": 6,
  "authors": [
    {
      "name": "Dushyant Singh"
    },
    {
      "name": "Tharundev V V"
    },
    {
      "name": "Subha Maity"
    },
    {
      "name": "Subhavenkadesh SS"
    },
    {
      "name": "Vigneshwari SR"
    },
    {
      "name": "Krista R. Khiangte"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/31ts6tx2zvxkf.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.33637",
  "fulltext_url": null,
  "id": "31ts6tx2zvxkf",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.33637",
  "language": null,
  "licence": "CC-BY-NC-ND-4.0",
  "licence_label": "CC BY-NC-ND 4.0",
  "licence_source": "article",
  "licence_url": "http://creativecommons.org/licenses/by-nc-nd/4.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mes-hall"
    ],
    [
      "arxiv",
      "cond-mat.mtrl-sci"
    ],
    [
      "openalex",
      "3107|Magnetic properties of thin films"
    ]
  ],
  "openalex": "W7223835671",
  "pdf_url": "https://arxiv.org/pdf/2610.33637",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-24",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/31ts6tx2zvxkf.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:35:35Z",
      "native_id": "2610.33637",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.33637"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mes-hall",
      "subfield": "condensed-matter"
    }
  ],
  "title": "Perpendicular Anisotropy and g-Factor of Sputtered Ni Films on Si(111) Studied by Angle-Dependent Ferromagnetic Resonance",
  "title_text": "Perpendicular Anisotropy and g-Factor of Sputtered Ni Films on Si(111) Studied by Angle-Dependent Ferromagnetic Resonance",
  "type": "preprint",
  "updated_at": "2026-10-30T12:35:35Z",
  "url": "https://research.draconitic.com/paper/31ts6tx2zvxkf",
  "venue": "arXiv",
  "versions": []
}