{
  "abstract": "Angle-resolved photoemission spectroscopy (ARPES) requires a well-ordered surface, whose quality is routinely judged from low-energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS). We compare LEED, XPS, and ARPES of a Cu(001) single crystal measured in situ at four stages of surface preparation: as-prepared, after aging for 24 h at 6 K, after Ar$^+$ sputtering, and after annealing. The sputtered and annealed surfaces show nearly identical $(1\\times1)$ LEED patterns and Cu 2$p$ core levels, but the sputtered surface yields a momentum-independent ARPES spectrum, and the band dispersion recovers after annealing. We attribute this contrast to how each probe responds to sputtering-induced defects: LEED reflects the average lattice, which remains periodic, whereas ARPES reflects the electronic states, whose crystal momentum is no longer well defined. Our results indicate that a sharp LEED pattern and clean core-level spectra do not guarantee a surface suitable for ARPES.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.16421",
  "author_total": 8,
  "authors": [
    {
      "name": "Hyeonhee Na"
    },
    {
      "name": "Jeonghwan Oh"
    },
    {
      "name": "Jinju Lee"
    },
    {
      "name": "Hanjun Sim"
    },
    {
      "name": "Myeongun Go"
    },
    {
      "name": "Jimin Sohn"
    },
    {
      "name": "Jeonggu Kang"
    },
    {
      "name": "Byungmin Sohn"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/5t03y1xcjsdyk.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.16421",
  "fulltext_url": null,
  "id": "5t03y1xcjsdyk",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.16421",
  "language": null,
  "licence": "CC-BY-4.0",
  "licence_label": "CC BY 4.0",
  "licence_source": "article",
  "licence_url": "http://creativecommons.org/licenses/by/4.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mtrl-sci"
    ],
    [
      "openalex",
      "2508|Electron and X-Ray Spectroscopy Techniques"
    ]
  ],
  "openalex": "W7221757676",
  "pdf_url": "https://arxiv.org/pdf/2610.16421",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-12",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/5t03y1xcjsdyk.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:29:06Z",
      "native_id": "2610.16421",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.16421"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mtrl-sci",
      "subfield": "condensed-matter"
    }
  ],
  "title": "Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)",
  "title_text": "Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)",
  "type": "preprint",
  "updated_at": "2026-10-30T12:29:06Z",
  "url": "https://research.draconitic.com/paper/5t03y1xcjsdyk",
  "venue": "arXiv",
  "versions": []
}