{
  "abstract": "Understanding the temporal and spatial dependence of temperature is critical in high-performance cryogenic devices. Typical thermometry techniques struggle to simultaneously combine high bandwidth, sensitivity and on-chip integration, limiting their ability to measure fast intra-device thermal fluctuations. Here, we demonstrate a time-resolved thermometry platform based on TiN kinetic inductance resonators integrated in a 22 nm FDSOI chip. By tracking temperature-dependent shifts in the resonant frequency, we achieve sub-millikelvin temperature sensitivity down to temperatures of 100 mK. Time-resolved on-chip pulsed heating experiments as a function of distance reveal an onset delay, consistent with a quasi-ballistic heat propagation velocity of 3.9 ${\\pm}$ 0.1 mm $μ$s${}^{-1}$. We also show that elevated temperatures increase net thermal conductance, shortening thermal relaxation times across all spatial separations. This behaviour manifests in two distinct regimes: a substrate-limited regime at 100 mK, where cooling rates vary with heater distance, and a Kapitza boundary-limited regime at 400 mK, where thermal relaxation becomes more spatially uniform. These measurements demonstrate kinetic inductance thermometry's ability to rapidly probe non-equilibrium temperature dynamics in cryogenic devices such as quantum processors.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2608.27057",
  "author_total": 12,
  "authors": [
    {
      "name": "Johann Drayne"
    },
    {
      "name": "George Ridgard"
    },
    {
      "name": "Lorenzo Peri"
    },
    {
      "name": "Frederic Schlattner"
    },
    {
      "name": "Fabio Olivieri"
    },
    {
      "name": "Mathieu de Kruijf"
    },
    {
      "name": "Isaac Harris"
    },
    {
      "name": "Grayson Noah"
    },
    {
      "name": "James Kirkman"
    },
    {
      "name": "Alberto Gomez-Saiz"
    },
    {
      "name": "M. Fernando Gonzalez-Zalba"
    },
    {
      "name": "Thomas Swift"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/8wv6yyenrvbh5.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2608.27057",
  "fulltext_url": null,
  "id": "8wv6yyenrvbh5",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2608.27057",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mes-hall"
    ],
    [
      "arxiv",
      "quant-ph"
    ],
    [
      "openalex",
      "3103|Superconducting and THz Device Technology"
    ]
  ],
  "openalex": "W7204548043",
  "pdf_url": "https://arxiv.org/pdf/2608.27057",
  "pmcid": null,
  "pmid": null,
  "published": "2026-08-28",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/8wv6yyenrvbh5.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:17:22Z",
      "native_id": "2608.27057",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2608.27057"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mes-hall",
      "subfield": "condensed-matter"
    },
    {
      "field": "physics",
      "origin": "arxiv:quant-ph",
      "subfield": "quantum"
    }
  ],
  "title": "Fast On-Chip Thermometry with TiN Kinetic Inductance Resonators in 22 nm Process Technology",
  "title_text": "Fast On-Chip Thermometry with TiN Kinetic Inductance Resonators in 22 nm Process Technology",
  "type": "preprint",
  "updated_at": "2026-10-30T12:17:22Z",
  "url": "https://research.draconitic.com/paper/8wv6yyenrvbh5",
  "venue": "arXiv",
  "versions": []
}