{
  "abstract": null,
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  "affiliations": [
    "College of Mechanical and Electrical Engineering, Sanming University, Sanming 365004, China",
    "School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100029, China"
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  "author_total": 8,
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      "name": "Zhongjian Gao"
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      "name": "Qingzhu Zhang"
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      "name": "Zhaohao Zhang"
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      "name": "Wenxiu Dong"
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      "name": "Wen Ren"
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      "name": "Ruige Zhang"
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  "bibtex": "https://research.draconitic.com/paper/9x40xxqh3gw25.bib",
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  "doi": null,
  "fulltext_url": "https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13666695/?tool=EBI",
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  "language": "eng",
  "licence": "CC-BY",
  "licence_label": "CC BY",
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  "pdf_url": "https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13666695/pdf/?tool=EBI",
  "pmcid": "PMC13666695",
  "pmid": null,
  "published": "2026-09-24",
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  "ris": "https://research.draconitic.com/paper/9x40xxqh3gw25.ris",
  "sources": [
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  "subjects": [
    {
      "field": "chemistry",
      "origin": "issn:2079-4991",
      "subfield": "materials-polymers"
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  ],
  "title": "Thickness Engineering in HfO2-Based Ferroelectrics: A Critical Review of Phase, Switching, Reliability, and Device Trade-Offs",
  "title_text": "Thickness Engineering in HfO2-Based Ferroelectrics: A Critical Review of Phase, Switching, Reliability, and Device Trade-Offs",
  "type": "peer-reviewed",
  "updated_at": "2026-10-30T12:17:41Z",
  "url": "https://research.draconitic.com/paper/9x40xxqh3gw25",
  "venue": "Nanomaterials (Basel, Switzerland)",
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}