{
  "abstract": "Atomic force microscopy (AFM) enables mass sensing through resonance-frequency changes of microcantilevers, but quantitative measurements can be affected by calibration and environmental factors. Here, we investigated whether a calibrated AFM cantilever and controlled mass loading could provide nanogram-scale mass estimation. Cantilevers were cleaned and calibrated by force-distance measurements, and resonance acquisition parameters were optimized under ambient conditions. UV-curable resin droplets were locally deposited on the cantilever to generate mass loading, and resonance-frequency shifts were measured and analyzed using a mass-spring model and finite-element simulations. Increasing resin mass produced progressive decreases in resonance frequency, demonstrating a consistent relationship between mass loading and cantilever resonance behavior. Finite-element simulations reproduced the resonance responses and supported the mass estimates obtained from the experimental measurements. These findings establish a calibration and modeling framework for resonance-based mass quantification using conventional AFM cantilevers and provide a basis for extending quantitative mass analysis to microstructures and biological assemblies.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": "Article",
  "arxiv": null,
  "author_total": 2,
  "authors": [
    {
      "name": "Sangwoo Kwon",
      "orcid": "0009-0007-3225-9251"
    },
    {
      "name": "Kyung Sook Kim"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/bh40x9ff77rvy.bib",
  "cited_by": 0,
  "doi": "10.1016/j.isci.2026.117900",
  "fulltext_url": "https://europepmc.org/articles/PMC13694898",
  "id": "bh40x9ff77rvy",
  "issns": [
    "2589-0042"
  ],
  "landing_url": "https://www.cell.com/iscience/fulltext/S2589-0042(26)03283-9",
  "language": "eng",
  "licence": "CC-BY-4.0",
  "licence_label": "CC BY 4.0",
  "licence_source": "article",
  "licence_url": "http://creativecommons.org/licenses/by/4.0/",
  "metadata_licence": null,
  "native_subjects": [
    [
      "heading",
      "Materials characterization"
    ],
    [
      "heading",
      "Nanotechnology fabrication"
    ],
    [
      "heading",
      "Sensor"
    ],
    [
      "openalex",
      "1607|Mass Spectrometry Techniques and Applications"
    ]
  ],
  "openalex": "W7221758721",
  "pdf_url": "https://europepmc.org/articles/PMC13694898?pdf=render",
  "pmcid": "PMC13694898",
  "pmid": "42927225",
  "published": "2026-10-14",
  "publisher": "Elsevier BV",
  "ris": "https://research.draconitic.com/paper/bh40x9ff77rvy.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:17:16Z",
      "native_id": "10.1016/j.isci.2026.117900",
      "source": "feed-cell",
      "url": "https://www.cell.com/iscience/fulltext/S2589-0042(26)03283-9"
    },
    {
      "first_seen": "2026-10-30T12:17:49Z",
      "native_id": "10.1016/j.isci.2026.117900",
      "source": "crossref",
      "url": "https://linkinghub.elsevier.com/retrieve/pii/S2589004226032839"
    },
    {
      "first_seen": "2026-10-30T12:21:18Z",
      "native_id": "MED:42927225",
      "source": "europepmc",
      "url": "https://europepmc.org/article/MED/42927225"
    }
  ],
  "subjects": [
    {
      "field": "chemistry",
      "origin": "openalex:1607|Mass Spectrometry Techniques and Applications",
      "subfield": "physical"
    }
  ],
  "title": "A systematic approach to quantitative nanoscale mass spectrometry using atomic force microscopy",
  "title_text": "A systematic approach to quantitative nanoscale mass spectrometry using atomic force microscopy",
  "type": "peer-reviewed",
  "updated_at": "2026-10-30T12:21:18Z",
  "url": "https://research.draconitic.com/paper/bh40x9ff77rvy",
  "venue": "iScience",
  "versions": []
}