{
  "abstract": null,
  "abstract_shown": false,
  "affiliations": [],
  "article_type": null,
  "arxiv": null,
  "author_total": 5,
  "authors": [
    {
      "name": "Gianmarco Mongelli"
    },
    {
      "name": "Eric Faehn"
    },
    {
      "name": "Dylan Robins"
    },
    {
      "name": "Patrick Girard"
    },
    {
      "name": "Arnaud Virazel"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/da8dvfh8rdejg.bib",
  "cited_by": 0,
  "doi": "10.1109/tcad.2026.3657675",
  "fulltext_url": null,
  "id": "da8dvfh8rdejg",
  "issns": [
    "0278-0070"
  ],
  "landing_url": "https://hal.science/hal-05786443v1",
  "language": "en",
  "licence": "LicenseRef-publisher-terms",
  "licence_label": "Publisher terms",
  "licence_source": "article",
  "licence_url": "https://hal.science/licences/copyright/",
  "metadata_licence": null,
  "native_subjects": [
    [
      "hal",
      "0.nlin"
    ],
    [
      "openalex",
      "1708|VLSI and Analog Circuit Testing"
    ]
  ],
  "openalex": "W7125605318",
  "pdf_url": "https://hal.science/hal-05786443/document",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-08",
  "publisher": "IEEE",
  "ris": "https://research.draconitic.com/paper/da8dvfh8rdejg.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:17:51Z",
      "native_id": "hal-05786443",
      "source": "hal",
      "url": "https://hal.science/hal-05786443v1"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "hal:0.nlin",
      "subfield": "statistical-nonlinear"
    }
  ],
  "title": "A Defect-Detection Graph-Based Methodology for Cell-Aware Model Generation",
  "title_text": "A Defect-Detection Graph-Based Methodology for Cell-Aware Model Generation",
  "type": "peer-reviewed",
  "updated_at": "2026-10-30T12:17:51Z",
  "url": "https://research.draconitic.com/paper/da8dvfh8rdejg",
  "venue": "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
  "versions": []
}