{
  "abstract": "High-pressure synchrotron X-ray diffraction increasingly produces hundreds to thousands of detector frames in a single experiment, while separating, assigning, and tracking weak reflections across an entire series often remain manual. This bottleneck is particularly severe for micron- and nanoscale samples in diamond-anvil cells, where scattering from the anvils, gasket, pressure medium, and pressure markers can dominate the sample signal. We present SeriesXRD, an open-source workflow that analyzes diffraction as a series rather than as independent patterns. The program suppresses azimuthally localized diamond scattering, subtracts background, fits and tracks reflections between frames, matches known phases using pressure-dependent lattice parameters, subtracts confidently assigned contributions, and groups persistent unexplained reflections for follow-up as candidate sample-associated or unknown-phase features. We demonstrate the method on 1288 frames collected from an approximately 30-nm-thick layered UOTe flake in a diamond-anvil cell over 3.5-50.7 GPa. The dataset is strongly background dominated, with detectable UOTe diffraction in only approximately 4% of the frames. SeriesXRD recovered the sample-associated reflections identified in the original manual analysis while reducing the corresponding phase-assignment and residual-analysis workflow from more than two months of researcher time to an overnight automated run. Across the full series, 17,143 peaks were fitted, 14,395 passed quality criteria, and 90% of accepted peaks were assigned to known background or reference phases. SeriesXRD therefore converts large, background-dominated diffraction series into a tractable set of phase assignments and coherent unexplained reflections while retaining a traceable record of each decision.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2611.00611",
  "author_total": 4,
  "authors": [
    {
      "name": "Rush Maples"
    },
    {
      "name": "Zackary Rehfuss"
    },
    {
      "name": "Hongyi Liu"
    },
    {
      "name": "Sheng Ran"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/dn1rmjeh9zhe6.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2611.00611",
  "fulltext_url": null,
  "id": "dn1rmjeh9zhe6",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2611.00611",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mtrl-sci"
    ]
  ],
  "openalex": null,
  "pdf_url": "https://arxiv.org/pdf/2611.00611",
  "pmcid": null,
  "pmid": null,
  "published": "2026-11-01",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/dn1rmjeh9zhe6.ris",
  "sources": [
    {
      "first_seen": "2026-11-03T12:20:59Z",
      "native_id": "2611.00611",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2611.00611"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mtrl-sci",
      "subfield": "condensed-matter"
    }
  ],
  "title": "SeriesXRD: automated reflection tracking and phase identification in high-pressure X-ray diffraction series",
  "title_text": "SeriesXRD: automated reflection tracking and phase identification in high-pressure X-ray diffraction series",
  "type": "preprint",
  "updated_at": "2026-11-05T15:20:18Z",
  "url": "https://research.draconitic.com/paper/dn1rmjeh9zhe6",
  "venue": "arXiv",
  "versions": []
}