{
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    "School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kanagawa, Japan, 214-8571",
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  "bibtex": "https://research.draconitic.com/paper/egyzxjcqp1k8p.bib",
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  "doi": "10.26434/chemrxiv.15005615/v3",
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  "published": "2026-08-31",
  "publisher": "American Chemical Society (ACS)",
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  "title": "Cross-exposure transferability and failure boundaries of self-supervised DNN denoising for AR-HAXPES depth profiling",
  "title_text": "Cross-exposure transferability and failure boundaries of self-supervised DNN denoising for AR-HAXPES depth profiling",
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