{
  "abstract": "The phase of an electron wave is sensitive to the local electrostatic environment and can therefore provide information about atomic-scale structural variations. In electron ptychography, however, specimen thickness, multiple scattering and projected atomic overlap can complicate the quantitative interpretation of the reconstructed phase. Here, we use a twisted trilayer WS2 thickness staircase containing monolayer, bilayer and trilayer regions as an internal reference, with all regions measured under identical experimental conditions. The mean W-column phase increases by approximately 13.2% from the monolayer to the bilayer region, compared with only 4.7% from the bilayer to the trilayer region, revealing a nonlinear thickness dependence. W-S overlap has little effect on the W-column phase, whereas short-range projected W-W overlap increases it by approximately 8-9%. These results provide a benchmark for evaluating quantitative phase measurement in multilayer WS2 and for assessing phase-based mapping of local electrostatic potential, charge-density and three-dimensional atomic-scale polarization.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.13115",
  "author_total": 9,
  "authors": [
    {
      "name": "Hu Bao"
    },
    {
      "name": "Qilong Feng"
    },
    {
      "name": "Kun Ye"
    },
    {
      "name": "Tianyu Xue"
    },
    {
      "name": "Stephen J. Pennycook"
    },
    {
      "name": "Yihan Zhu"
    },
    {
      "name": "Anmin Nie"
    },
    {
      "name": "Shoucong Ning"
    },
    {
      "name": "Jing Tao"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/f0mrf4gndg2bt.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.13115",
  "fulltext_url": null,
  "id": "f0mrf4gndg2bt",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.13115",
  "language": null,
  "licence": "CC-BY-NC-ND-4.0",
  "licence_label": "CC BY-NC-ND 4.0",
  "licence_source": "article",
  "licence_url": "http://creativecommons.org/licenses/by-nc-nd/4.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mtrl-sci"
    ],
    [
      "openalex",
      "1315|Advanced Electron Microscopy Techniques and Applications"
    ]
  ],
  "openalex": "W7221522362",
  "pdf_url": "https://arxiv.org/pdf/2610.13115",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-09",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/f0mrf4gndg2bt.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:28:36Z",
      "native_id": "2610.13115",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.13115"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mtrl-sci",
      "subfield": "condensed-matter"
    }
  ],
  "title": "Assessing quantitative phase reliability in electron ptychography using a twisted trilayer WS2 thickness staircase",
  "title_text": "Assessing quantitative phase reliability in electron ptychography using a twisted trilayer WS2 thickness staircase",
  "type": "preprint",
  "updated_at": "2026-10-30T12:28:36Z",
  "url": "https://research.draconitic.com/paper/f0mrf4gndg2bt",
  "venue": "arXiv",
  "versions": []
}