{
  "abstract": "Transient-skyrmion mediated voltage-controlled magnetic anisotropy (VCMA) switching is a fast and energy efficient way to magnetization reversal, but its reliability under realistic material disorder and thermal fluctuations remain unclear. In this work, we use stochastic micromagnetic simulations of a 100 nm perpendicular magnetic tunnel junction to study switching reliability under grain-scale variations in Dzyaloshinskii-Moriya interaction, perpendicular magnetic anisotropy, easy-axis orientation, and intergrain exchange coupling. We find that switching remains robust under moderate disorder, with 100% switching observed in 10^4 stochastic simulations after pulse width optimization at both 300 K and 350 K. Increasing the temperature from 300 to 350 K shifts the optimum VCMA pulse width from ~475 to ~450 ps, indicating that an apparent reduction in switching probability at a fixed pulse duration can be primarily due to pulse detuning. In contrast, strong easy-axis disorder reduces the maximum switching probability even after pulse-width optimization, indicating degradation of the switching dynamics. We further show that, under strong easy-axis disorder a transient skyrmion still forms while the subsequent post-pulse dynamics fails to complete the magnetization reversal. Our study therefore establishes the distinction between recoverable reliability due to timing shifts and permanent disorder-induced degradation that simply cannot be recovered by pulse re-tuning. Finally, for no disorders but at room temperature, 100% switching is observed with 10^6 stochastic simulations with correct pulse shaping.",
  "abstract_shown": true,
  "affiliations": [],
  "article_type": null,
  "arxiv": "2610.32944",
  "author_total": 3,
  "authors": [
    {
      "name": "Prosenjit Das"
    },
    {
      "name": "Md Mahadi Rajib"
    },
    {
      "name": "Jayasimha Atulasimha"
    }
  ],
  "bibtex": "https://research.draconitic.com/paper/f3ynaj2father.bib",
  "cited_by": 0,
  "doi": "10.48550/arxiv.2610.32944",
  "fulltext_url": null,
  "id": "f3ynaj2father",
  "issns": [],
  "landing_url": "https://arxiv.org/abs/2610.32944",
  "language": null,
  "licence": "LicenseRef-arXiv-nonexclusive-1.0",
  "licence_label": "arXiv licence",
  "licence_source": "article",
  "licence_url": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
  "metadata_licence": "CC0-1.0",
  "native_subjects": [
    [
      "arxiv",
      "cond-mat.mes-hall"
    ],
    [
      "openalex",
      "3107|Magnetic properties of thin films"
    ]
  ],
  "openalex": "W7223695968",
  "pdf_url": "https://arxiv.org/pdf/2610.32944",
  "pmcid": null,
  "pmid": null,
  "published": "2026-10-23",
  "publisher": null,
  "ris": "https://research.draconitic.com/paper/f3ynaj2father.ris",
  "sources": [
    {
      "first_seen": "2026-10-30T12:35:15Z",
      "native_id": "2610.32944",
      "source": "arxiv",
      "url": "https://arxiv.org/abs/2610.32944"
    }
  ],
  "subjects": [
    {
      "field": "physics",
      "origin": "arxiv:cond-mat.mes-hall",
      "subfield": "condensed-matter"
    }
  ],
  "title": "Robustness of Skyrmion-Mediated Magnetization Switching in Perpendicular Magnetic Tunnel Junctions (p-MTJs) to Material Disorder and Elevated Temperature",
  "title_text": "Robustness of Skyrmion-Mediated Magnetization Switching in Perpendicular Magnetic Tunnel Junctions (p-MTJs) to Material Disorder and Elevated Temperature",
  "type": "preprint",
  "updated_at": "2026-10-30T12:35:15Z",
  "url": "https://research.draconitic.com/paper/f3ynaj2father",
  "venue": "arXiv",
  "versions": []
}