Subtracting Interferences in X‐Ray Spectra Obtained With Grating Spectrometers

Abstract

Higher order diffraction from surface contamination poses a major challenge for soft x‐ray spectral analysis using reflection zone plate spectrometers in electron probe microanalysis. We developed two correction methods applied to the Al L 2,3 and Zn M 2,3 emissions in AlZn60 alloy spectra: sequential overlay and subtraction of C Kα and O Kα reference spectra, and subtraction of O Kα higher order contributions using an isolated peak of the sample under study. The second subtraction method provides superior correction of oxygen interferences while preserving intrinsic emission shapes. These approaches were validated on the Si L and Al L bands of the leuchtenbergite mineral.

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BibTeX RIS

BibTeX

@article{temmar2026subtracting,
  title = {{Subtracting Interferences in X‐Ray Spectra Obtained With Grating Spectrometers}},
  author = {Nawel Temmar and Philippe Jonnard and Karine Le Guen and Nicolas Rividi and Wanqiu Bai},
  journal = {X-Ray Spectrometry},
  year = {2026},
  month = may,
  doi = {10.1002/xrs.70118},
  url = {https://hal.science/hal-05627492v2},
  note = {CC BY 4.0},
}

RIS

TY  - JOUR
TI  - Subtracting Interferences in X‐Ray Spectra Obtained With Grating Spectrometers
AU  - Nawel Temmar
AU  - Philippe Jonnard
AU  - Karine Le Guen
AU  - Nicolas Rividi
AU  - Wanqiu Bai
PY  - 2026
DA  - 2026/05/19
JO  - X-Ray Spectrometry
DO  - 10.1002/xrs.70118
UR  - https://hal.science/hal-05627492v2
AB  - Higher order diffraction from surface contamination poses a major challenge for soft x‐ray spectral analysis using reflection zone plate spectrometers in electron probe microanalysis. We developed two correction methods applied to the Al L 2,3 and Zn M 2,3 emissions in AlZn60 alloy spectra: sequential overlay and subtraction of C Kα and O Kα reference spectra, and subtraction of O Kα higher order contributions using an isolated peak of the sample under study. The second subtraction method provides superior correction of oxygen interferences while preserving intrinsic emission shapes. These approaches were validated on the Si L and Al L bands of the leuchtenbergite mineral.
SN  - 0049-8246
SN  - 1097-4539
ER  -

Abstract

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