Peer-reviewedCC BYSensors (Basel, Switzerland)
Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays
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BibTeX
@article{anon2026investigation,
title = {{Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays}},
journal = {Sensors (Basel, Switzerland)},
year = {2026},
month = oct,
url = {https://europepmc.org/article/PMC/PMC13667396},
note = {CC BY},
}
RIS
TY - JOUR
TI - Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays
PY - 2026
DA - 2026/10/01
JO - Sensors (Basel, Switzerland)
UR - https://europepmc.org/article/PMC/PMC13667396
SN - 1424-8220
ER -