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PreprintCC BY 4.0arXiv

Absorption and Phase-Contrast Microtomography Using Direct X-Ray Detection With Commercial Off-The-Shelf CMOS Sensors

Abstract

This work presents high-resolution X-ray microtomography based on commercial off-the-shelf (COTS) CMOS image sensors as direct detectors. The system uses a microfocus X-ray source in cone-beam geometry, enabling both absorption-contrast imaging, thanks to the sensor s intrinsic resolution, and phase-contrast imaging, by adjusting the object-to-sensor distance. A dynamic flat-field correction algorithm mitigates radiation-induced sensor degradation during long acquisitions. The setup provides voxel sizes from 3.9 microns to 5.2 microns, with an effective spatial resolution (FWHM) as fine as 9.6 microns in magnified phase-contrast mode (1.33x) and 21 microns in non-magnified absorption-contrast mode. Phase contrast enhances visualization of soft tissue boundaries that are difficult to visualize using absorption-contrast imaging in the same experimental configuration.

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BibTeX
@misc{corzi2026absorption,
  title = {{Absorption and Phase-Contrast Microtomography Using Direct X-Ray Detection With Commercial Off-The-Shelf CMOS Sensors}},
  author = {Damian L. Corzi and Jose Lipovetzky and Fabricio Alcalde Bessia and German Mato and Andres Cicuttin and Maria L. Crespo and Martin Perez and Mariano Gomez Berisso},
  howpublished = {arXiv},
  year = {2026},
  month = oct,
  doi = {10.48550/arxiv.2605.29808},
  eprint = {2605.29808},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2605.29808},
  note = {CC BY 4.0},
}
RIS
TY  - UNPB
TI  - Absorption and Phase-Contrast Microtomography Using Direct X-Ray Detection With Commercial Off-The-Shelf CMOS Sensors
AU  - Damian L. Corzi
AU  - Jose Lipovetzky
AU  - Fabricio Alcalde Bessia
AU  - German Mato
AU  - Andres Cicuttin
AU  - Maria L. Crespo
AU  - Martin Perez
AU  - Mariano Gomez Berisso
PY  - 2026
DA  - 2026/10/15
PB  - arXiv
DO  - 10.48550/arxiv.2605.29808
UR  - https://arxiv.org/abs/2605.29808
AB  - This work presents high-resolution X-ray microtomography based on commercial off-the-shelf (COTS) CMOS image sensors as direct detectors. The system uses a microfocus X-ray source in cone-beam geometry, enabling both absorption-contrast imaging, thanks to the sensor s intrinsic resolution, and phase-contrast imaging, by adjusting the object-to-sensor distance. A dynamic flat-field correction algorithm mitigates radiation-induced sensor degradation during long acquisitions. The setup provides voxel sizes from 3.9 microns to 5.2 microns, with an effective spatial resolution (FWHM) as fine as 9.6 microns in magnified phase-contrast mode (1.33x) and 21 microns in non-magnified absorption-contrast mode. Phase contrast enhances visualization of soft tissue boundaries that are difficult to visualize using absorption-contrast imaging in the same experimental configuration.
ER  -