Peer-reviewedHAL deposit licenceOptics Communications
All-optical erasing of photorefractive solitonic X-Junctions in lithium niobate thin-film on insulator
Related
- Phase-Controlled Majorana Zero Modes in Altermagnetic Topological-Insulator Josephson Junctions
- Tunneling spectroscopy of topological insulator Josephson junctions
- Magnetotransport experiments on side-contacted topological insulator three-terminal Josephson junctions
- High-speed, compact and low-crosstalk lithium niobate on insulator 2 × 2 optical switch for on-chip integration
- Optical control of electrons in a Floquet topological insulator
BibTeX
@article{bile2026alloptical,
title = {{All-optical erasing of photorefractive solitonic X-Junctions in lithium niobate thin-film on insulator}},
author = {Alessandro Bile and Mathieu Chauvet and Eugenio Fazio},
journal = {Optics Communications},
year = {2026},
month = sep,
doi = {10.1016/j.optcom.2026.133605},
url = {https://hal.science/hal-05756437v1},
}
RIS
TY - JOUR
TI - All-optical erasing of photorefractive solitonic X-Junctions in lithium niobate thin-film on insulator
AU - Alessandro Bile
AU - Mathieu Chauvet
AU - Eugenio Fazio
PY - 2026
DA - 2026/09/21
JO - Optics Communications
DO - 10.1016/j.optcom.2026.133605
UR - https://hal.science/hal-05756437v1
SN - 0030-4018
SN - 1873-0310
ER -