Resistance mapping in mesoscopic films of low dimensional materials.
- 12D Foundry Research Group. Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), Madrid, Spain. [email protected].
- 2Dipartimento di Fisica, Università di Roma "La Sapienza", I-00185 Roma, Italy.
Abstract
We present a low-cost, scalable technique for mapping local electrical properties across large areas with micrometer-scale lateral resolution. The method utilizes a flexible polymer cantilever coated by microfabricated graphite electrodes to probe local surface resistance. Samples can be scanned on a motorized translation stage, enabling automated, spatially resolved electrical measurements over centimeter-scale regions. The use of graphite electrodes ensures low friction and wear for both the sample and the electrodes, allowing repeated measurements on thin films without sample damage, unlike conventional metal probes. We demonstrate robust, pixel-by-pixel resistance maps on various samples, including patterned graphite thin films and ITO on glass structures. Its simplicity, adaptability, and user-friendly operation make this platform well-suited for rapid electrical testing and high-throughput quality control in advanced electronics research.
Related
- Failure of Conventional Roughness Metrics in Assessing Field-Limiting Mesoscopic Topography in SRF Nb Films on Cu
- Induced nonlinear phase shift of forward volume spin waves in magnetic films and one-dimensional magnonic crystals
- Coupled dynamical Boltzmann transport equations with long-range electron-phonon and electron-electron interactions in two-dimensional materials
- Bipolarized Weyl semimetals and quantum crystal valley Hall effect in two-dimensional altermagnetic materials
- Sound velocity mapping from GHz Brillouin oscillations in transparent materials by optical incidence from the side of the sample
BibTeX
@article{galizia2026resistance,
title = {{Resistance mapping in mesoscopic films of low dimensional materials.}},
author = {Nicolò Galizia and Rafael Luque Merino and Yigit Sozen and J J Riquelme and Riccardo Frisenda and Andres Castellanos-Gomez},
journal = {Nanoscale},
year = {2026},
month = oct,
doi = {10.1039/d6nr01610c},
url = {https://europepmc.org/article/MED/42895648},
note = {CC BY-NC},
}
RIS
TY - JOUR
TI - Resistance mapping in mesoscopic films of low dimensional materials.
AU - Nicolò Galizia
AU - Rafael Luque Merino
AU - Yigit Sozen
AU - J J Riquelme
AU - Riccardo Frisenda
AU - Andres Castellanos-Gomez
PY - 2026
DA - 2026/10/19
JO - Nanoscale
DO - 10.1039/d6nr01610c
UR - https://europepmc.org/article/MED/42895648
AB - We present a low-cost, scalable technique for mapping local electrical properties across large areas with micrometer-scale lateral resolution. The method utilizes a flexible polymer cantilever coated by microfabricated graphite electrodes to probe local surface resistance. Samples can be scanned on a motorized translation stage, enabling automated, spatially resolved electrical measurements over centimeter-scale regions. The use of graphite electrodes ensures low friction and wear for both the sample and the electrodes, allowing repeated measurements on thin films without sample damage, unlike conventional metal probes. We demonstrate robust, pixel-by-pixel resistance maps on various samples, including patterned graphite thin films and ITO on glass structures. Its simplicity, adaptability, and user-friendly operation make this platform well-suited for rapid electrical testing and high-throughput quality control in advanced electronics research.
SN - 2040-3364
SN - 2040-3372
ER -