Spatially-Resolved Viscoelastic Response with AFM-IR
11 affiliations
- 1Department of Materials Science and Engineering
- 2Stanford University
- 3Department of Electrical and Computer Engineering
- 4University of Maryland
- 5Bruker Nano Surfaces Division
- 6Department of Chemistry
- 7Department of Chemical Engineering
- 8Department of Mechanical Engineering
- 9Kyushu University
- 10Nanoscale Device Characterization Division
- 11National Institute of Standards and Technology
Abstract
The viscoelastic response of phase-separated polymers systems may deviate from bulk values at the nanoscale. However, current measurement techniques lack the resolution to unmask local variations. We previously demonstrated the advantages of using a focused, pulsed infrared (IR) laser to photothermally heat a sample locally during nanomechanical measurements with an atomic force microscope (AFM), with heating controlled by varying the laser repetition rate. Herein, we demonstrate this IR heating coupled with nano-Dynamic Mechanical Analysis (nDMA). First, we measured the storage and loss modulus of a homogenous copolymer at varying IR repetition rates (i.e., at varying sample temperature), demonstrating a viscoelastic modulus response that is typical near the glass transition temperature. Further, we varied the IR laser repetition rate while modulating the AFM probe between 5 Hz and 100 Hz. With time-temperature superposition, modulus master curves were constructed through the Williams-Landel-Ferry relation, and the shift factors of IR heating-coupled nDMA curves were used to estimate the relation between IR repetition rate and surface temperatures. Lastly, this technique was applied to a phase-separated polymer blend to demonstrate the utility of the technique to decouple the viscoelastic behavior of different phases by leveraging the high spatial resolution of AFM.
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BibTeX
@misc{lim2026spatiallyresolved,
title = {{Spatially-Resolved Viscoelastic Response with AFM-IR}},
author = {Carina Yi Jing Lim and Jeffrey J. Schwartz and Bede Pittenger and Yuran Shi and Yoko Tomo and Peter De Wolf and Andrea Centrone and Zhenan Bao and Lukas Michalek},
howpublished = {ChemRxiv},
year = {2026},
month = oct,
doi = {10.26434/chemrxiv.15000735/v4},
url = {https://chemrxiv.org/doi/full/10.26434/chemrxiv.15000735/v4},
note = {CC BY},
}
RIS
TY - UNPB
TI - Spatially-Resolved Viscoelastic Response with AFM-IR
AU - Carina Yi Jing Lim
AU - Jeffrey J. Schwartz
AU - Bede Pittenger
AU - Yuran Shi
AU - Yoko Tomo
AU - Peter De Wolf
AU - Andrea Centrone
AU - Zhenan Bao
AU - Lukas Michalek
PY - 2026
DA - 2026/10/02
PB - ChemRxiv
DO - 10.26434/chemrxiv.15000735/v4
UR - https://chemrxiv.org/doi/full/10.26434/chemrxiv.15000735/v4
AB - The viscoelastic response of phase-separated polymers systems may deviate from bulk values at the nanoscale. However, current measurement techniques lack the resolution to unmask local variations. We previously demonstrated the advantages of using a focused, pulsed infrared (IR) laser to photothermally heat a sample locally during nanomechanical measurements with an atomic force microscope (AFM), with heating controlled by varying the laser repetition rate. Herein, we demonstrate this IR heating coupled with nano-Dynamic Mechanical Analysis (nDMA). First, we measured the storage and loss modulus of a homogenous copolymer at varying IR repetition rates (i.e., at varying sample temperature), demonstrating a viscoelastic modulus response that is typical near the glass transition temperature. Further, we varied the IR laser repetition rate while modulating the AFM probe between 5 Hz and 100 Hz. With time-temperature superposition, modulus master curves were constructed through the Williams-Landel-Ferry relation, and the shift factors of IR heating-coupled nDMA curves were used to estimate the relation between IR repetition rate and surface temperatures. Lastly, this technique was applied to a phase-separated polymer blend to demonstrate the utility of the technique to decouple the viscoelastic behavior of different phases by leveraging the high spatial resolution of AFM.
ER -