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Peer-reviewedCC BYSensors (Basel, Switzerland)

Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions

  • Sinan Yavuz1
  • Edwin Naroska2
  • Kai Daniel3
  • Roman Obermaisser1
  1. 1Department of Electrical Engineering and Computer Science, , 57076 Siegen, Germany;
  2. 2Department of Electrical Engineering and Computer Science, Hochschule Niederrhein University of Applied Sciences, 47805 Krefeld, Germany;
  3. 3Institute of Measurement and Sensor Technology, University of Applied Sciences Ruhr West, 45479 Mülheim, Germany;
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Cite

BibTeXRIS
BibTeX
@article{yavuz2026investigating,
  title = {{Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions}},
  author = {Sinan Yavuz and Edwin Naroska and Kai Daniel and Roman Obermaisser},
  journal = {Sensors (Basel, Switzerland)},
  year = {2026},
  month = oct,
  url = {https://europepmc.org/article/PMC/PMC13667447},
  note = {CC BY},
}
RIS
TY  - JOUR
TI  - Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions
AU  - Sinan Yavuz
AU  - Edwin Naroska
AU  - Kai Daniel
AU  - Roman Obermaisser
PY  - 2026
DA  - 2026/10/01
JO  - Sensors (Basel, Switzerland)
UR  - https://europepmc.org/article/PMC/PMC13667447
SN  - 1424-8220
ER  -