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Peer-reviewedCC BY 4.0Nanomaterials

Size Effect and Crystal–Melt Interfacial Tension in the Formation of Alloys from Ultrafine Sublayers of Dissimilar Metals

  1. 1Institute of Nuclear Physics, Satbayev University, Almaty 050032, Kazakhstan

Abstract

Thirty-four binary systems were prepared by co-sputtering dissimilar metals onto a moving substrate. In the present work, the experimentally controlled size parameter is the nominal thickness of a single metal sublayer deposited during one substrate passage rather than a directly measured nanoparticle diameter. A formal linear fit between the characteristic sublayer thickness and the bulk melting temperature gives the empirical relation dMe=1.46−7.3×10−5T0, with a low coefficient of determination, R2=0.007, indicating that the bulk melting temperature alone explains only a small part of the observed variation. Alloy composition and deposition conditions also affect the characteristic sublayer thickness. Using the Thomson equation within an effective-size approximation, the crystal–melt interfacial tension of the constituent metals was estimated. The approach provides a practical framework for selecting deposition conditions for the synthesis of binary alloy systems, while the calculated interfacial-tension values should be regarded as model-based estimates.

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BibTeX
@article{volodin2026size,
  title = {{Size Effect and Crystal–Melt Interfacial Tension in the Formation of Alloys from Ultrafine Sublayers of Dissimilar Metals}},
  author = {Valeriy Volodin and Yuriy Tuleushev and Yeldar Zhakanbayev and Bakytzhan Tynyshbay},
  journal = {Nanomaterials},
  year = {2026},
  month = oct,
  doi = {10.3390/nano16201303},
  url = {https://www.mdpi.com/2079-4991/16/20/1303},
  note = {CC BY 4.0},
}
RIS
TY  - JOUR
TI  - Size Effect and Crystal–Melt Interfacial Tension in the Formation of Alloys from Ultrafine Sublayers of Dissimilar Metals
AU  - Valeriy Volodin
AU  - Yuriy Tuleushev
AU  - Yeldar Zhakanbayev
AU  - Bakytzhan Tynyshbay
PY  - 2026
DA  - 2026/10/15
JO  - Nanomaterials
DO  - 10.3390/nano16201303
UR  - https://www.mdpi.com/2079-4991/16/20/1303
AB  - Thirty-four binary systems were prepared by co-sputtering dissimilar metals onto a moving substrate. In the present work, the experimentally controlled size parameter is the nominal thickness of a single metal sublayer deposited during one substrate passage rather than a directly measured nanoparticle diameter. A formal linear fit between the characteristic sublayer thickness and the bulk melting temperature gives the empirical relation dMe=1.46−7.3×10−5T0, with a low coefficient of determination, R2=0.007, indicating that the bulk melting temperature alone explains only a small part of the observed variation. Alloy composition and deposition conditions also affect the characteristic sublayer thickness. Using the Thomson equation within an effective-size approximation, the crystal–melt interfacial tension of the constituent metals was estimated. The approach provides a practical framework for selecting deposition conditions for the synthesis of binary alloy systems, while the calculated interfacial-tension values should be regarded as model-based estimates.
SN  - 2079-4991
ER  -