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PreprintCC BY-NC-ND 4.0arXiv

Absolute Calibration of a Broadband Transmission Grating Spectrometer from 5 to 400 nm with Uncertainty Estimates

Abstract

We present the absolute calibration of a transmission grating spectrometer (TGS) with uncertainty estimates in the 5--400 nm range using synchrotron radiation at the BEAR beamline at Elettra light source in Trieste, Italy. Firstly, the spectral responsivity of a Si photodiode in the spectrometer was absolutely calibrated with respect to the absolutely-calibrated beamline photodiode. Subsequently, this photodiode was used to calibrate the transmittance of Zr and Al thin-film filters, along with bulk MgF2 and UV-grade fused silica windows at their operating positions in the spectrometer to minimize mounting-induced uncertainties. Next, the quantum efficiency of the spectrometer's CCD camera was calibrated over the 5--400 nm range. Lastly, three gratings with line densities of 10000, 3000, and 1000 lines/mm were calibrated for spectroscopy in the ranges extending from soft X-ray to extreme-, vacuum- and deep-ultraviolet (DUV) wavelengths, respectively. The combination of various filters and gratings enables absolutely calibrated spectroscopy with high versatility across a broad wavelength range from soft X-rays to DUV.

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BibTeX
@misc{chebykin2026absolute,
  title = {{Absolute Calibration of a Broadband Transmission Grating Spectrometer from 5 to 400 nm with Uncertainty Estimates}},
  author = {E. Chebykin and A. E. H. Gaballah and R. van der Horst and A. Giglia and N. Mahne and M. van de Kerkhof and M. D. Ackermann and M. Bayraktar},
  howpublished = {arXiv},
  year = {2026},
  month = nov,
  doi = {10.48550/arxiv.2611.09288},
  eprint = {2611.09288},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2611.09288},
  note = {CC BY-NC-ND 4.0},
}
RIS
TY  - UNPB
TI  - Absolute Calibration of a Broadband Transmission Grating Spectrometer from 5 to 400 nm with Uncertainty Estimates
AU  - E. Chebykin
AU  - A. E. H. Gaballah
AU  - R. van der Horst
AU  - A. Giglia
AU  - N. Mahne
AU  - M. van de Kerkhof
AU  - M. D. Ackermann
AU  - M. Bayraktar
PY  - 2026
DA  - 2026/11/06
PB  - arXiv
DO  - 10.48550/arxiv.2611.09288
UR  - https://arxiv.org/abs/2611.09288
AB  - We present the absolute calibration of a transmission grating spectrometer (TGS) with uncertainty estimates in the 5--400 nm range using synchrotron radiation at the BEAR beamline at Elettra light source in Trieste, Italy. Firstly, the spectral responsivity of a Si photodiode in the spectrometer was absolutely calibrated with respect to the absolutely-calibrated beamline photodiode. Subsequently, this photodiode was used to calibrate the transmittance of Zr and Al thin-film filters, along with bulk MgF_2 and UV-grade fused silica windows at their operating positions in the spectrometer to minimize mounting-induced uncertainties. Next, the quantum efficiency of the spectrometer's CCD camera was calibrated over the 5--400 nm range. Lastly, three gratings with line densities of 10000, 3000, and 1000 lines/mm were calibrated for spectroscopy in the ranges extending from soft X-ray to extreme-, vacuum- and deep-ultraviolet (DUV) wavelengths, respectively. The combination of various filters and gratings enables absolutely calibrated spectroscopy with high versatility across a broad wavelength range from soft X-rays to DUV.
ER  -