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PreprintCC BY-NC-NDChemRxiv

Perovskite Photovoltaics in January-June 2026: The Certified Frontier From Cell to Module

  • Havid Aqoma1,2,3,4,5,6
6 affiliations
  1. 1School of Energy and Chemical Engineering
  2. 2Xiamen University Malaysia
  3. 3Kelip-kelip! Center of Excellence for Light Enabling Technologies, School of Energy and Chemical Engineering
  4. 4Centre of Excellence for Green and Advanced Technologies in Effcient Separations (GATES), School of Energy and Chemical Engineering
  5. 5Gulei Innovation Institute
  6. 6Xiamen University
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Abstract

Over an evaluation period spanning 6 months, the metal halide perovskite literature expanded by 3328 indexed publications. Of these, 884 were examined closely for physical claims, interfacial mechanisms, and stability validation across distinct device architectures. Across single junction devices, the certified power conversion efficiency (PCE) ceiling advanced to 27.6%, yet mechanistic investigations diverged over the operational function of low-dimensional capping heterostructures. Several studies concluded that wide-bandgap surface caps suppress non-radiative recombination and impede halide migration without hindering transport, while competing evidence demonstrated that disordered organic spacer phases create severe charge-transport barriers, accumulate photogenerated carriers under illumination, and penalize fill factor (FF). In all-perovskite tandems, performance ceilings remained governed by the chemical vulnerability of narrow-bandgap (NBG) mixed tin-lead sub-cells. Chemical hardness engineering and nucleation control synchronized crystallization and suppressed localized tin-rich defect segregation. Physical evidence that this arrests autonomous divalent-to-tetravalent tin oxidation cascades during continuous operation remains thin and contested. Monolithic hybrid tandems paired with silicon or chalcogenide bottom absorbers established the issue-wide ceiling of 34.85% certified PCE, and exposed an acute mechanistic dispute over buried hole-selective layer (HSL) contacts. One body of work holds that dense intermolecular pi-pi stacking and strict crystalline order within self-assembled monolayers (SAMs) are required to align interfacial energy levels and eliminate pinholes. A second holds that crystalline domains induce nanoscale grain boundaries and thermal dewetting, so that sterically hindered, amorphous molecular geometries preserve conformal passivation more reliably. Translating these absorbers into perovskite solar modules (PSMs) incurred a steep area penalty, with certified PCE falling to 26.8% at the largest reported aperture area of 655.2 cm2. Reports conflict over whether that penalty is dominated by non-radiative recombination at laser scribing margins, by convective drying instabilities generating coffee-ring solute segregation, or by heterogeneous out-of-plane residual lattice strain across the bulk film. Operational stability verification remains sparse and fragmented across all architectures: only 39 publications designated a standardized consensus protocol from the International Summit on Organic Photovoltaic Stability (ISOS), and only 39 studies reported an operational lifetime metric, with the longest duration reaching 4100 h under continuous illumination. Reporting rigor varies widely across device families, in that 52.1% of published abstracts state an efficiency value, yet only 8.5% report independent certification, representing just 114 certified works across the surveyed corpus. Progress in perovskite photovoltaics has therefore decoupled from uncertified efficiency metrics, and has shifted toward coupled ionic-electronic degradation under operating electrical and thermal stress. Resolving buried contact degradation between out-of-plane molecular desorption and lateral field-induced dewetting requires operando bias-dependent sum-frequency generation and conductive atomic force microscopy. Settling open-circuit voltage (Voc) losses demands operando drive-level capacitance profiling (DLCP) coupled with depth-resolved photoluminescence quantum yield (PLQY) mapping, to distinguish true defect passivation from electrostatic band realignment.

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Cite

BibTeXRIS
BibTeX
@misc{aqoma2026perovskite,
  title = {{Perovskite Photovoltaics in January-June 2026: The Certified Frontier From Cell to Module}},
  author = {Havid Aqoma},
  howpublished = {ChemRxiv},
  year = {2026},
  month = sep,
  doi = {10.26434/chemrxiv.15009155/v1},
  url = {https://chemrxiv.org/doi/full/10.26434/chemrxiv.15009155/v1},
  note = {CC BY-NC-ND},
}
RIS
TY  - UNPB
TI  - Perovskite Photovoltaics in January-June 2026: The Certified Frontier From Cell to Module
AU  - Havid Aqoma
PY  - 2026
DA  - 2026/09/21
PB  - ChemRxiv
DO  - 10.26434/chemrxiv.15009155/v1
UR  - https://chemrxiv.org/doi/full/10.26434/chemrxiv.15009155/v1
AB  - Over an evaluation period spanning 6 months, the metal halide perovskite literature expanded by 3328 indexed publications. Of these, 884 were examined closely for physical claims, interfacial mechanisms, and stability validation across distinct device architectures. Across single junction devices, the certified power conversion efficiency (PCE) ceiling advanced to 27.6%, yet mechanistic investigations diverged over the operational function of low-dimensional capping heterostructures. Several studies concluded that wide-bandgap surface caps suppress non-radiative recombination and impede halide migration without hindering transport, while competing evidence demonstrated that disordered organic spacer phases create severe charge-transport barriers, accumulate photogenerated carriers under illumination, and penalize fill factor (FF). In all-perovskite tandems, performance ceilings remained governed by the chemical vulnerability of narrow-bandgap (NBG) mixed tin-lead sub-cells. Chemical hardness engineering and nucleation control synchronized crystallization and suppressed localized tin-rich defect segregation. Physical evidence that this arrests autonomous divalent-to-tetravalent tin oxidation cascades during continuous operation remains thin and contested. Monolithic hybrid tandems paired with silicon or chalcogenide bottom absorbers established the issue-wide ceiling of 34.85% certified PCE, and exposed an acute mechanistic dispute over buried hole-selective layer (HSL) contacts. One body of work holds that dense intermolecular pi-pi stacking and strict crystalline order within self-assembled monolayers (SAMs) are required to align interfacial energy levels and eliminate pinholes. A second holds that crystalline domains induce nanoscale grain boundaries and thermal dewetting, so that sterically hindered, amorphous molecular geometries preserve conformal passivation more reliably. Translating these absorbers into perovskite solar modules (PSMs) incurred a steep area penalty, with certified PCE falling to 26.8% at the largest reported aperture area of 655.2 cm2. Reports conflict over whether that penalty is dominated by non-radiative recombination at laser scribing margins, by convective drying instabilities generating coffee-ring solute segregation, or by heterogeneous out-of-plane residual lattice strain across the bulk film. Operational stability verification remains sparse and fragmented across all architectures: only 39 publications designated a standardized consensus protocol from the International Summit on Organic Photovoltaic Stability (ISOS), and only 39 studies reported an operational lifetime metric, with the longest duration reaching 4100 h under continuous illumination. Reporting rigor varies widely across device families, in that 52.1% of published abstracts state an efficiency value, yet only 8.5% report independent certification, representing just 114 certified works across the surveyed corpus. Progress in perovskite photovoltaics has therefore decoupled from uncertified efficiency metrics, and has shifted toward coupled ionic-electronic degradation under operating electrical and thermal stress. Resolving buried contact degradation between out-of-plane molecular desorption and lateral field-induced dewetting requires operando bias-dependent sum-frequency generation and conductive atomic force microscopy. Settling open-circuit voltage (Voc) losses demands operando drive-level capacitance profiling (DLCP) coupled with depth-resolved photoluminescence quantum yield (PLQY) mapping, to distinguish true defect passivation from electrostatic band realignment.
ER  -