Peer-reviewedPublisher termsOptics Express
Design and analysis of single-layer f-θ metalens enabling wide-field-of-view, low-distortion scanning
- 1Anhui University
- 2Hefei Chipmore Microelectronics Equipment Co., Ltd.
- 3East China Research Institute of Electronic Engineering
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BibTeX
@article{zhou2026design,
title = {{Design and analysis of single-layer f-θ metalens enabling wide-field-of-view, low-distortion scanning}},
author = {Shicheng Zhou and Tong Jiang and Hao Ding and Mandi Rong and Yunshuo Xie and Linze Chen and Wenjie Xie and Li Ding and Xingang Ren and Zhixiang Huang},
journal = {Optics Express},
year = {2026},
month = oct,
doi = {10.1364/oe.610508},
url = {https://opg.optica.org/abstract.cfm?URI=oe-34-21-38900},
}
RIS
TY - JOUR
TI - Design and analysis of single-layer f-θ metalens enabling wide-field-of-view, low-distortion scanning
AU - Shicheng Zhou
AU - Tong Jiang
AU - Hao Ding
AU - Mandi Rong
AU - Yunshuo Xie
AU - Linze Chen
AU - Wenjie Xie
AU - Li Ding
AU - Xingang Ren
AU - Zhixiang Huang
PY - 2026
DA - 2026/10/06
JO - Optics Express
DO - 10.1364/oe.610508
UR - https://opg.optica.org/abstract.cfm?URI=oe-34-21-38900
SN - 1094-4087
ER -