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Peer-reviewedCC BY 4.0Carbon

Controlled high-current-induced scanning tunnelling microscope modification of C60

  • Ewan Scougall
  • Bastien Anézo
  • Yuri Tanuma
  • Henry Chandler
  • Chris Ewels
  • Renald Schaub
  • Eleanor E.B. Campbell
Open at sourcePDFDOICite

Abstract

We demonstrate controlled STM-induced modification/destruction of Ih-C60 supported on a Cu(111) surface, showing that the molecule is more resilient to high currents for bias voltages greater than ca. 3.5 V. This is due to the enhanced charge transport through the diffuse SAMO orbitals of the molecule with lower probability for electron-vibration coupling than found for resonant low bias transport through it-molecular orbitals. Experimental and theoretical DFT results demonstrate the destruction mechanism comes from C2 emission from the fullerene cage and the formation of smaller fullerenes via sequential emission of C2.

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Cite

BibTeXRIS
BibTeX
@article{scougall2026controlled,
  title = {{Controlled high-current-induced scanning tunnelling microscope modification of C60}},
  author = {Ewan Scougall and Bastien Anézo and Yuri Tanuma and Henry Chandler and Chris Ewels and Renald Schaub and Eleanor E.B. Campbell},
  journal = {Carbon},
  year = {2026},
  month = oct,
  doi = {10.1016/j.carbon.2025.120251},
  url = {https://hal.science/hal-05082631v2},
  note = {CC BY 4.0},
}
RIS
TY  - JOUR
TI  - Controlled high-current-induced scanning tunnelling microscope modification of C60
AU  - Ewan Scougall
AU  - Bastien Anézo
AU  - Yuri Tanuma
AU  - Henry Chandler
AU  - Chris Ewels
AU  - Renald Schaub
AU  - Eleanor E.B. Campbell
PY  - 2026
DA  - 2026/10/06
JO  - Carbon
DO  - 10.1016/j.carbon.2025.120251
UR  - https://hal.science/hal-05082631v2
AB  - We demonstrate controlled STM-induced modification/destruction of Ih-C60 supported on a Cu(111) surface, showing that the molecule is more resilient to high currents for bias voltages greater than ca. 3.5 V. This is due to the enhanced charge transport through the diffuse SAMO orbitals of the molecule with lower probability for electron-vibration coupling than found for resonant low bias transport through it-molecular orbitals. Experimental and theoretical DFT results demonstrate the destruction mechanism comes from C2 emission from the fullerene cage and the formation of smaller fullerenes via sequential emission of C2.
SN  - 0008-6223
ER  -