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Peer-reviewedPublisher termsOptics Express

InP-compatible InGaAs/GaAsSb type-II superlattice eSWIR FPA with 2.7 µm cutoff: radiometric calibration and 3D noise analysis

  • Jiaying Li1,2
  • Hongyue Hao2,3
  • Ruoyu Xie2,3
  • Yifan Shan2,3
  • Xiangbin Su2,3
  • Dongwei Jiang2,3
  • Donghai Wu2,3
  • Guowei Wang2,3
  • Yingqiang Xu2,3
  • Haiqiao Ni2,3
  • Wengang Bi1
  • Zhichuan Niu2,3
  1. 1The Chinese University of Hong Kong (Shenzhen)
  2. 2Institute of Semiconductors
  3. 3University of Chinese Academy of Sciences
Open at sourceDOICite

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Cite

BibTeXRIS
BibTeX
@article{li2026inpcompatible,
  title = {{InP-compatible InGaAs/GaAsSb type-II superlattice eSWIR FPA with 2.7 µm cutoff: radiometric calibration and 3D noise analysis}},
  author = {Jiaying Li and Hongyue Hao and Ruoyu Xie and Yifan Shan and Xiangbin Su and Dongwei Jiang and Donghai Wu and Guowei Wang and Yingqiang Xu and Haiqiao Ni and Wengang Bi and Zhichuan Niu},
  journal = {Optics Express},
  year = {2026},
  month = oct,
  doi = {10.1364/oe.612263},
  url = {https://opg.optica.org/abstract.cfm?URI=oe-34-22-40846},
}
RIS
TY  - JOUR
TI  - InP-compatible InGaAs/GaAsSb type-II superlattice eSWIR FPA with 2.7 µm cutoff: radiometric calibration and 3D noise analysis
AU  - Jiaying Li
AU  - Hongyue Hao
AU  - Ruoyu Xie
AU  - Yifan Shan
AU  - Xiangbin Su
AU  - Dongwei Jiang
AU  - Donghai Wu
AU  - Guowei Wang
AU  - Yingqiang Xu
AU  - Haiqiao Ni
AU  - Wengang Bi
AU  - Zhichuan Niu
PY  - 2026
DA  - 2026/10/19
JO  - Optics Express
DO  - 10.1364/oe.612263
UR  - https://opg.optica.org/abstract.cfm?URI=oe-34-22-40846
SN  - 1094-4087
ER  -