Simulation of the electron escape ratio for keV alpha-particle ionization tracks in liquid helium
Abstract
The electron escape ratio for 5.3 MeV alpha-particle ionization tracks in liquid helium under varying external electric fields has been measured in several experiments. However, to the best of our knowledge, the corresponding ratio for keV-scale alpha tracks in the same medium has not yet been reported. In this article, we demonstrate for the first time that this ratio can be accurately characterized using COMSOL-based simulations. Our simulation framework was developed in two stages. In Stage I, we aimed to verify consistency between our simulated results and published experimental data for 5.3 MeV alpha particles. Following successful verification in Stage I, we proceeded to Stage II, in which the 5.3 MeV track was replaced by 2, 5, and 10 keV tracks. Our simulated results reveal that (a) keV-scale tracks exhibit electron escape ratios approximately 1.5-2.5 times higher than that of the 5.3 MeV track, and (b) the escape ratios for all track energies (2, 5, 10 keV, and 5.3 MeV) exhibit a linear dependence on the ion number density at the simulation's T0, but not on the electron number density.
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BibTeX
@misc{hu2026simulation,
title = {{Simulation of the electron escape ratio for keV alpha-particle ionization tracks in liquid helium}},
author = {Zihuai Hu and Junhui Liao and Zhuo Liang and Guangpeng An and Zhaohua Peng and Jian Zheng and Lifeng Zhang and Lei Zhang and Yuanning Gao},
howpublished = {arXiv},
year = {2026},
month = sep,
doi = {10.48550/arxiv.2609.02166},
eprint = {2609.02166},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2609.02166},
note = {CC BY-NC-ND 4.0},
}
RIS
TY - UNPB
TI - Simulation of the electron escape ratio for keV alpha-particle ionization tracks in liquid helium
AU - Zihuai Hu
AU - Junhui Liao
AU - Zhuo Liang
AU - Guangpeng An
AU - Zhaohua Peng
AU - Jian Zheng
AU - Lifeng Zhang
AU - Lei Zhang
AU - Yuanning Gao
PY - 2026
DA - 2026/09/02
PB - arXiv
DO - 10.48550/arxiv.2609.02166
UR - https://arxiv.org/abs/2609.02166
AB - The electron escape ratio for 5.3 MeV alpha-particle ionization tracks in liquid helium under varying external electric fields has been measured in several experiments. However, to the best of our knowledge, the corresponding ratio for keV-scale alpha tracks in the same medium has not yet been reported. In this article, we demonstrate for the first time that this ratio can be accurately characterized using COMSOL-based simulations. Our simulation framework was developed in two stages. In Stage I, we aimed to verify consistency between our simulated results and published experimental data for 5.3 MeV alpha particles. Following successful verification in Stage I, we proceeded to Stage II, in which the 5.3 MeV track was replaced by 2, 5, and 10 keV tracks. Our simulated results reveal that (a) keV-scale tracks exhibit electron escape ratios approximately 1.5-2.5 times higher than that of the 5.3 MeV track, and (b) the escape ratios for all track energies (2, 5, 10 keV, and 5.3 MeV) exhibit a linear dependence on the ion number density at the simulation's T0, but not on the electron number density.
ER -