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PreprintCC BY-NC-SA 4.0arXiv

Probing the physical origins of 1/f noise by nonlinear transport

Abstract

We report measurements of low frequency noise in the nonlinear electron transport of tunnel junctions that are dc or ac biased. We show that not only the resistance but also the nonlinear coefficients exhibit 1/f-like noise, and that correlations among them exist. Using the common theoretical model for electron transport in tunnel junctions, we relate our measurements to fluctuations of barrier heights. We show in particular that the barrier heights on either side of the junction have strong fluctuations that are almost perfectly anti-correlated.

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BibTeX
@misc{fontaine2026probing,
  title = {{Probing the physical origins of 1/f noise by nonlinear transport}},
  author = {Nicolas Fontaine and Bertrand Reulet},
  howpublished = {arXiv},
  year = {2026},
  month = oct,
  doi = {10.48550/arxiv.2610.26592},
  eprint = {2610.26592},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2610.26592},
  note = {CC BY-NC-SA 4.0},
}
RIS
TY  - UNPB
TI  - Probing the physical origins of 1/f noise by nonlinear transport
AU  - Nicolas Fontaine
AU  - Bertrand Reulet
PY  - 2026
DA  - 2026/10/19
PB  - arXiv
DO  - 10.48550/arxiv.2610.26592
UR  - https://arxiv.org/abs/2610.26592
AB  - We report measurements of low frequency noise in the nonlinear electron transport of tunnel junctions that are dc or ac biased. We show that not only the resistance but also the nonlinear coefficients exhibit 1/f-like noise, and that correlations among them exist. Using the common theoretical model for electron transport in tunnel junctions, we relate our measurements to fluctuations of barrier heights. We show in particular that the barrier heights on either side of the junction have strong fluctuations that are almost perfectly anti-correlated.
ER  -