Step-Scan Interferometry for High-Fidelity Hyperspectral Nanoscopy
Abstract
Fourier transform infrared nanospectroscopy (nano-FTIR) is an increasingly adopted characterization method that leverages decades of established knowledge in infrared spectroscopy at the nanoscale. It enables detailed characterization of composite materials and nanophotonic systems. Besides the rapid adoption and tremendous possibilities, the nanoscale nature of these measurements poses additional challenges for infrared spectroscopy. The current implementations of hyperspectral image acquisition at high spatial resolution suffer from significant artifacts due to thermal instabilities, which heavily affect positioning. As a result, the spatial and spectral fidelity of the measurements can be unreliable for long acquisitions. Here, we propose an alternative nano-FTIR measurement methodology based on step-scan interferometry and image registration. We demonstrate the spatial and spectral fidelity of our method and show how it enables the collection of high-quality, large data sets, making it possible to apply machine learning in photonics research to characterize nanoscale heterogeneity.
Related
- Scan-less Hyperspectral Polarimetric Imaging Using Dual-Comb Single-Pixel Imaging
- Relaxing Coherence Requirements on Laser Sources for Nanoscopy through Optical Fiber Technique
- Terahertz nanoscopy of quantum-geometric photovoltaics in bilayer graphene
- Liquid-Phase Near-Field Infrared Nanoscopy of Ion-Exchange Reactions
- Spatiotemporal terahertz emission nanoscopy of spintronic photocurrent
BibTeX
@article{nemeth2026stepscan,
title = {{Step-Scan Interferometry for High-Fidelity Hyperspectral Nanoscopy}},
author = {Gergely Németh and Ferenc Borondics},
journal = {ACS Nano},
year = {2026},
month = aug,
doi = {10.1021/acsnano.6c09426},
eprint = {2605.21249},
archivePrefix = {arXiv},
url = {https://hal.science/hal-05803977v1},
note = {CC BY 4.0},
}
RIS
TY - JOUR
TI - Step-Scan Interferometry for High-Fidelity Hyperspectral Nanoscopy
AU - Gergely Németh
AU - Ferenc Borondics
PY - 2026
DA - 2026/08/11
JO - ACS Nano
DO - 10.1021/acsnano.6c09426
UR - https://hal.science/hal-05803977v1
AB - Fourier transform infrared nanospectroscopy (nano-FTIR) is an increasingly adopted characterization method that leverages decades of established knowledge in infrared spectroscopy at the nanoscale. It enables detailed characterization of composite materials and nanophotonic systems. Besides the rapid adoption and tremendous possibilities, the nanoscale nature of these measurements poses additional challenges for infrared spectroscopy. The current implementations of hyperspectral image acquisition at high spatial resolution suffer from significant artifacts due to thermal instabilities, which heavily affect positioning. As a result, the spatial and spectral fidelity of the measurements can be unreliable for long acquisitions. Here, we propose an alternative nano-FTIR measurement methodology based on step-scan interferometry and image registration. We demonstrate the spatial and spectral fidelity of our method and show how it enables the collection of high-quality, large data sets, making it possible to apply machine learning in photonics research to characterize nanoscale heterogeneity.
SN - 1936-0851
SN - 1936-086X
ER -