PreprintCC BY 4.0arXiv
Field Angular Momentum Transformation as a Resolution Criterion for Microsphere-assisted microscopy
Abstract
This paper presents a sequential analysis of the resolving power of a microparticle as a function of its refractive index and size parameter. We demonstrate that the resolution of a microparticle for incoherent point sources is fundamentally determined by the number of excited Mie modes. Based on this mechanism, we propose a novel quantitative assessment framework that defines the spatial resolution limit via the ratio of the squared field angular momentum of the source to that of the total particle field (comprising the superposition of the source and scattered fields). The analytical results demonstrate good agreement with both numerical modeling and classical limits.
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BibTeX
@misc{arlen2026field,
title = {{Field Angular Momentum Transformation as a Resolution Criterion for Microsphere-assisted microscopy}},
author = {Bekirov Arlen},
howpublished = {arXiv},
year = {2026},
month = oct,
doi = {10.48550/arxiv.2609.17214},
eprint = {2609.17214},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2609.17214},
note = {CC BY 4.0},
}
RIS
TY - UNPB
TI - Field Angular Momentum Transformation as a Resolution Criterion for Microsphere-assisted microscopy
AU - Bekirov Arlen
PY - 2026
DA - 2026/10/19
PB - arXiv
DO - 10.48550/arxiv.2609.17214
UR - https://arxiv.org/abs/2609.17214
AB - This paper presents a sequential analysis of the resolving power of a microparticle as a function of its refractive index and size parameter. We demonstrate that the resolution of a microparticle for incoherent point sources is fundamentally determined by the number of excited Mie modes. Based on this mechanism, we propose a novel quantitative assessment framework that defines the spatial resolution limit via the ratio of the squared field angular momentum of the source to that of the total particle field (comprising the superposition of the source and scattered fields). The analytical results demonstrate good agreement with both numerical modeling and classical limits.
ER -