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Peer-reviewedPublisher termsOptics Express

Model-fitting perspective on the robustness and speed of CLASS in reflection matrix microscopy

  • Wannes Luts De Martelaere
  • Dinh-Hoang Tran
  • Hojun Lee
  • Kalpak Gupta
  • Ye-Ryoung Lee1
  • Sungsam Kang
  • Seokchan Yoon2
  • Wonshik Choi
  1. 1Konkuk University
  2. 2Pusan National University
Open at sourceDOICite

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Cite

BibTeXRIS
BibTeX
@article{martelaere2026modelfitting,
  title = {{Model-fitting perspective on the robustness and speed of CLASS in reflection matrix microscopy}},
  author = {Wannes Luts De Martelaere and Dinh-Hoang Tran and Hojun Lee and Kalpak Gupta and Ye-Ryoung Lee and Sungsam Kang and Seokchan Yoon and Wonshik Choi},
  journal = {Optics Express},
  year = {2026},
  month = oct,
  doi = {10.1364/oe.614136},
  url = {https://opg.optica.org/abstract.cfm?URI=oe-34-22-41425},
}
RIS
TY  - JOUR
TI  - Model-fitting perspective on the robustness and speed of CLASS in reflection matrix microscopy
AU  - Wannes Luts De Martelaere
AU  - Dinh-Hoang Tran
AU  - Hojun Lee
AU  - Kalpak Gupta
AU  - Ye-Ryoung Lee
AU  - Sungsam Kang
AU  - Seokchan Yoon
AU  - Wonshik Choi
PY  - 2026
DA  - 2026/10/21
JO  - Optics Express
DO  - 10.1364/oe.614136
UR  - https://opg.optica.org/abstract.cfm?URI=oe-34-22-41425
SN  - 1094-4087
ER  -