Drift Reduction in 2D PtSe2 Piezoresistive Pressure Sensors Through an On‐Chip Wheatstone Bridge
- 1Chair of Electronic Devices RWTH Aachen University Aachen Germany
- 2Institute of Physics & SENS Research Centre University of the Bundeswehr Munich Neubiberg Germany
Abstract
Drift is a major cause of error affecting the accuracy and repeatability of sensors. For a sensor to be reliable, it must consistently output the same response to a constant physical quantity of interest under varying environmental conditions. A Wheatstone bridge (WSB) enables high sensitivity, accuracy, and common‐mode drift elimination, making it ideal for sensors with potentially high cross‐sensitivity. In this work, we apply this concept to highly sensitive piezoresistive pressure sensors made with two‐dimensional layered platinum diselenide (PtSe2) transducers. By integrating the sensors into on‐chip WSBs, we minimize illumination‐induced drift, thereby enhancing overall sensor performance. The WSB‐integrated PtSe2 pressure sensors were tested under ambient light and controlled illumination to quantify both the repeatability error and drift. The results demonstrate that the WSB effectively eliminates illumination‐induced drift relative to a reference sensor in a two‐probe configuration. This suggests that our WSB design is also more robust to other environmental factors, such as temperature and humidity.
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BibTeX
@article{gupta2026drift,
title = {{Drift Reduction in 2D PtSe2 Piezoresistive Pressure Sensors Through an On‐Chip Wheatstone Bridge}},
author = {Ragini Gupta and Sebastian Lukas and Nico Rademacher and Michael Gross and Nikolas Dominik and Georg S. Duesberg and Max C. Lemme},
journal = {Advanced Electronic Materials},
year = {2026},
month = oct,
doi = {10.1002/aelm.70514},
url = {https://doi.org/10.1002/aelm.70514},
note = {CC BY},
}
RIS
TY - JOUR
TI - Drift Reduction in 2D PtSe2 Piezoresistive Pressure Sensors Through an On‐Chip Wheatstone Bridge
AU - Ragini Gupta
AU - Sebastian Lukas
AU - Nico Rademacher
AU - Michael Gross
AU - Nikolas Dominik
AU - Georg S. Duesberg
AU - Max C. Lemme
PY - 2026
DA - 2026/10/26
JO - Advanced Electronic Materials
DO - 10.1002/aelm.70514
UR - https://doi.org/10.1002/aelm.70514
AB - Drift is a major cause of error affecting the accuracy and repeatability of sensors. For a sensor to be reliable, it must consistently output the same response to a constant physical quantity of interest under varying environmental conditions. A Wheatstone bridge (WSB) enables high sensitivity, accuracy, and common‐mode drift elimination, making it ideal for sensors with potentially high cross‐sensitivity. In this work, we apply this concept to highly sensitive piezoresistive pressure sensors made with two‐dimensional layered platinum diselenide (PtSe2) transducers. By integrating the sensors into on‐chip WSBs, we minimize illumination‐induced drift, thereby enhancing overall sensor performance. The WSB‐integrated PtSe2 pressure sensors were tested under ambient light and controlled illumination to quantify both the repeatability error and drift. The results demonstrate that the WSB effectively eliminates illumination‐induced drift relative to a reference sensor in a two‐probe configuration. This suggests that our WSB design is also more robust to other environmental factors, such as temperature and humidity.
SN - 2199-160X
ER -