XPS Analysis of Co–Ni Alloy Passive Layers: Computational Peak-on-Satellite Analysis of 2p Core Levels Reveals the Influence of the Co/Ni Ratio on Oxide Chemistry and Structure
Abstract
Thin native oxide films spontaneously formed on a series of cobalt–nickel alloys with varying cobalt concentrations were investigated using X-ray photoemission spectroscopy (XPS). Combining XPS with sequential ion abrasion allowed identification of the various oxides and hydroxides present within the passive layers, depending on their depth in the films, which do not exceed 5 nm. A recent study of the Co20Ni80 alloy showed that the surface layer is heterogeneous both laterally and in depth, with some regions covered by oxidized cobalt compounds and others by oxidized nickel compounds. Different oxide thicknesses were observed on the Co20Ni80 alloy compared to pure Ni and Co metals. In the present study, we investigate the thicknesses and compositions of cobalt and nickel oxide films in binary alloys CoxNi100–x, with x = 0, 20, 50, 70, 90, and 100. Building on the previous study of Co20Ni80, where a surface galvanic effect induced by alloying was proposed, we show that variations in Co concentration suggest that the magnetic properties of the substrate influence the composition of the passivation layers formed on the cobalt–nickel alloys.
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BibTeX
@article{laik2026analysis,
title = {{XPS Analysis of Co–Ni Alloy Passive Layers: Computational Peak-on-Satellite Analysis of 2p Core Levels Reveals the Influence of the Co/Ni Ratio on Oxide Chemistry and Structure}},
author = {Barbara Laïk and Morgane Richet and Nicolas Emery and Loïc Perrière and Yvan Cotrebil and Vincent Russier and Ivan Guillot and Pierre Dubot},
journal = {ACS Omega},
year = {2026},
month = jun,
doi = {10.1021/acsomega.6c00562},
url = {https://hal.science/hal-05759964v1},
note = {CC BY-NC-ND 4.0},
}
RIS
TY - JOUR
TI - XPS Analysis of Co–Ni Alloy Passive Layers: Computational Peak-on-Satellite Analysis of 2p Core Levels Reveals the Influence of the Co/Ni Ratio on Oxide Chemistry and Structure
AU - Barbara Laïk
AU - Morgane Richet
AU - Nicolas Emery
AU - Loïc Perrière
AU - Yvan Cotrebil
AU - Vincent Russier
AU - Ivan Guillot
AU - Pierre Dubot
PY - 2026
DA - 2026/06/08
JO - ACS Omega
DO - 10.1021/acsomega.6c00562
UR - https://hal.science/hal-05759964v1
AB - Thin native oxide films spontaneously formed on a series of cobalt–nickel alloys with varying cobalt concentrations were investigated using X-ray photoemission spectroscopy (XPS). Combining XPS with sequential ion abrasion allowed identification of the various oxides and hydroxides present within the passive layers, depending on their depth in the films, which do not exceed 5 nm. A recent study of the Co20Ni80 alloy showed that the surface layer is heterogeneous both laterally and in depth, with some regions covered by oxidized cobalt compounds and others by oxidized nickel compounds. Different oxide thicknesses were observed on the Co20Ni80 alloy compared to pure Ni and Co metals. In the present study, we investigate the thicknesses and compositions of cobalt and nickel oxide films in binary alloys CoxNi100–x, with x = 0, 20, 50, 70, 90, and 100. Building on the previous study of Co20Ni80, where a surface galvanic effect induced by alloying was proposed, we show that variations in Co concentration suggest that the magnetic properties of the substrate influence the composition of the passivation layers formed on the cobalt–nickel alloys.
SN - 2470-1343
ER -