A systematic approach to quantitative nanoscale mass spectrometry using atomic force microscopy
Abstract
Atomic force microscopy (AFM) enables mass sensing through resonance-frequency changes of microcantilevers, but quantitative measurements can be affected by calibration and environmental factors. Here, we investigated whether a calibrated AFM cantilever and controlled mass loading could provide nanogram-scale mass estimation. Cantilevers were cleaned and calibrated by force-distance measurements, and resonance acquisition parameters were optimized under ambient conditions. UV-curable resin droplets were locally deposited on the cantilever to generate mass loading, and resonance-frequency shifts were measured and analyzed using a mass-spring model and finite-element simulations. Increasing resin mass produced progressive decreases in resonance frequency, demonstrating a consistent relationship between mass loading and cantilever resonance behavior. Finite-element simulations reproduced the resonance responses and supported the mass estimates obtained from the experimental measurements. These findings establish a calibration and modeling framework for resonance-based mass quantification using conventional AFM cantilevers and provide a basis for extending quantitative mass analysis to microstructures and biological assemblies.
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BibTeX
@article{kwon2026systematic,
title = {{A systematic approach to quantitative nanoscale mass spectrometry using atomic force microscopy}},
author = {Sangwoo Kwon and Kyung Sook Kim},
journal = {iScience},
year = {2026},
month = oct,
doi = {10.1016/j.isci.2026.117900},
url = {https://www.cell.com/iscience/fulltext/S2589-0042(26)03283-9},
note = {CC BY 4.0},
}
RIS
TY - JOUR
TI - A systematic approach to quantitative nanoscale mass spectrometry using atomic force microscopy
AU - Sangwoo Kwon
AU - Kyung Sook Kim
PY - 2026
DA - 2026/10/14
JO - iScience
DO - 10.1016/j.isci.2026.117900
UR - https://www.cell.com/iscience/fulltext/S2589-0042(26)03283-9
AB - Atomic force microscopy (AFM) enables mass sensing through resonance-frequency changes of microcantilevers, but quantitative measurements can be affected by calibration and environmental factors. Here, we investigated whether a calibrated AFM cantilever and controlled mass loading could provide nanogram-scale mass estimation. Cantilevers were cleaned and calibrated by force-distance measurements, and resonance acquisition parameters were optimized under ambient conditions. UV-curable resin droplets were locally deposited on the cantilever to generate mass loading, and resonance-frequency shifts were measured and analyzed using a mass-spring model and finite-element simulations. Increasing resin mass produced progressive decreases in resonance frequency, demonstrating a consistent relationship between mass loading and cantilever resonance behavior. Finite-element simulations reproduced the resonance responses and supported the mass estimates obtained from the experimental measurements. These findings establish a calibration and modeling framework for resonance-based mass quantification using conventional AFM cantilevers and provide a basis for extending quantitative mass analysis to microstructures and biological assemblies.
SN - 2589-0042
ER -