Peer-reviewedCC BYSensors (Basel, Switzerland)
Nondestructive Characterization of Internal Defects in Prebaked Anodes Using Open Electrical Impedance Tomography
- 1School of Physics and Mechatronic Engineering, , Guiyang 550025, China
- 2Guiyang Aluminum Magnesium Design & Research Institute Co., Ltd., Guiyang 550081, China
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BibTeX
@article{huang2026nondestructive,
title = {{Nondestructive Characterization of Internal Defects in Prebaked Anodes Using Open Electrical Impedance Tomography}},
author = {Ziyang Huang and Xiaosong Zhou and Mingquan Qiu and Tongchao Luo and Zuhuai Wu and Rong Xiang and Qi Zhao},
journal = {Sensors (Basel, Switzerland)},
year = {2026},
month = sep,
url = {https://europepmc.org/article/PMC/PMC13667419},
note = {CC BY},
}
RIS
TY - JOUR
TI - Nondestructive Characterization of Internal Defects in Prebaked Anodes Using Open Electrical Impedance Tomography
AU - Ziyang Huang
AU - Xiaosong Zhou
AU - Mingquan Qiu
AU - Tongchao Luo
AU - Zuhuai Wu
AU - Rong Xiang
AU - Qi Zhao
PY - 2026
DA - 2026/09/30
JO - Sensors (Basel, Switzerland)
UR - https://europepmc.org/article/PMC/PMC13667419
SN - 1424-8220
ER -