Wide-Angle Multislice Propagation for Electron Microscopy: Comparison of Fresnel, Angular-Spectrum, and Wave-Propagation Methods
Abstract
We introduce wave-propagation multislice (WP-MS), an adaptation of the wave propagation method (WPM) from scalar light optics that incorporates the refractive-index dependence of the local wavelength into wide-angle angular-spectrum propagation. Conventional Fresnel multislice (F-MS) is computationally efficient and widely used in transmission electron microscopy, but its paraxial propagation kernel loses accuracy when large scattering angles contribute to the exit wave in thick samples, and it ignores the local wavelength variation of the beam as it propagates through the sample. We compare WP-MS, F-MS, and angular-spectrum multislice (AS-MS) against a numerical solution of the second-order scalar Klein–Gordon equation on simulated test cases of Au [100] and Si [111] crystals. AS-MS removes most of the Fresnel wide-angle error at essentially the same per-slice cost. WP-MS provides a further local-medium correction at higher cost, but its difference from AS-MS is smaller than the F-MS discrepancy under the high-energy conditions studied here.
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BibTeX
@misc{landers2026wideangle,
title = {{Wide-Angle Multislice Propagation for Electron Microscopy: Comparison of Fresnel, Angular-Spectrum, and Wave-Propagation Methods}},
author = {David Landers and Jean-Luc Rouvière},
howpublished = {HAL},
year = {2026},
month = sep,
url = {https://hal.science/hal-05740210v1},
note = {CC BY 4.0},
}
RIS
TY - UNPB
TI - Wide-Angle Multislice Propagation for Electron Microscopy: Comparison of Fresnel, Angular-Spectrum, and Wave-Propagation Methods
AU - David Landers
AU - Jean-Luc Rouvière
PY - 2026
DA - 2026/09/07
PB - HAL
UR - https://hal.science/hal-05740210v1
AB - We introduce wave-propagation multislice (WP-MS), an adaptation of the wave propagation method (WPM) from scalar light optics that incorporates the refractive-index dependence of the local wavelength into wide-angle angular-spectrum propagation. Conventional Fresnel multislice (F-MS) is computationally efficient and widely used in transmission electron microscopy, but its paraxial propagation kernel loses accuracy when large scattering angles contribute to the exit wave in thick samples, and it ignores the local wavelength variation of the beam as it propagates through the sample. We compare WP-MS, F-MS, and angular-spectrum multislice (AS-MS) against a numerical solution of the second-order scalar Klein–Gordon equation on simulated test cases of Au [100] and Si [111] crystals. AS-MS removes most of the Fresnel wide-angle error at essentially the same per-slice cost. WP-MS provides a further local-medium correction at higher cost, but its difference from AS-MS is smaller than the F-MS discrepancy under the high-energy conditions studied here.
ER -