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Peer-reviewedCC BYSensors (Basel, Switzerland)

An Explainable Attention-Enhanced Deep Learning Model for Memory-Forensic Malware Detection

  1. 1Department of Software Engineering, , Abuja 900107, Nigeria
  2. 2Department of Computer Science, , Glasgow G4 0BA, UK

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BibTeX
@article{adejoh2026explainable,
  title = {{An Explainable Attention-Enhanced Deep Learning Model for Memory-Forensic Malware Detection}},
  author = {John Adejoh and Nsikak Pius Owoh and Moses Ashawa and Rajesh Prasad and Chibuzor Ezeamasiobi and Rajiv Ranjan Singh},
  journal = {Sensors (Basel, Switzerland)},
  year = {2026},
  month = oct,
  url = {https://europepmc.org/article/PMC/PMC13708950},
  note = {CC BY},
}
RIS
TY  - JOUR
TI  - An Explainable Attention-Enhanced Deep Learning Model for Memory-Forensic Malware Detection
AU  - John Adejoh
AU  - Nsikak Pius Owoh
AU  - Moses Ashawa
AU  - Rajesh Prasad
AU  - Chibuzor Ezeamasiobi
AU  - Rajiv Ranjan Singh
PY  - 2026
DA  - 2026/10/01
JO  - Sensors (Basel, Switzerland)
UR  - https://europepmc.org/article/PMC/PMC13708950
SN  - 1424-8220
ER  -