Peer-reviewedCC BYSensors (Basel, Switzerland)
An Explainable Attention-Enhanced Deep Learning Model for Memory-Forensic Malware Detection
- 1Department of Software Engineering, , Abuja 900107, Nigeria
- 2Department of Computer Science, , Glasgow G4 0BA, UK
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BibTeX
@article{adejoh2026explainable,
title = {{An Explainable Attention-Enhanced Deep Learning Model for Memory-Forensic Malware Detection}},
author = {John Adejoh and Nsikak Pius Owoh and Moses Ashawa and Rajesh Prasad and Chibuzor Ezeamasiobi and Rajiv Ranjan Singh},
journal = {Sensors (Basel, Switzerland)},
year = {2026},
month = oct,
url = {https://europepmc.org/article/PMC/PMC13708950},
note = {CC BY},
}
RIS
TY - JOUR
TI - An Explainable Attention-Enhanced Deep Learning Model for Memory-Forensic Malware Detection
AU - John Adejoh
AU - Nsikak Pius Owoh
AU - Moses Ashawa
AU - Rajesh Prasad
AU - Chibuzor Ezeamasiobi
AU - Rajiv Ranjan Singh
PY - 2026
DA - 2026/10/01
JO - Sensors (Basel, Switzerland)
UR - https://europepmc.org/article/PMC/PMC13708950
SN - 1424-8220
ER -