Peer-reviewedPublisher termsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A Defect-Detection Graph-Based Methodology for Cell-Aware Model Generation
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BibTeX
@article{mongelli2026defectdetection,
title = {{A Defect-Detection Graph-Based Methodology for Cell-Aware Model Generation}},
author = {Gianmarco Mongelli and Eric Faehn and Dylan Robins and Patrick Girard and Arnaud Virazel},
journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
year = {2026},
month = oct,
doi = {10.1109/tcad.2026.3657675},
url = {https://hal.science/hal-05786443v1},
}
RIS
TY - JOUR
TI - A Defect-Detection Graph-Based Methodology for Cell-Aware Model Generation
AU - Gianmarco Mongelli
AU - Eric Faehn
AU - Dylan Robins
AU - Patrick Girard
AU - Arnaud Virazel
PY - 2026
DA - 2026/10/08
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DO - 10.1109/tcad.2026.3657675
UR - https://hal.science/hal-05786443v1
SN - 0278-0070
ER -