Skip to content
DraconiticResearch
Search Sources API
203,234 studies31 sourcesUpdated 9 min ago
Peer-reviewedLicence not statedOptics Express

Diffractive optical-digital neural networks for robust EUV mask phase-defect characterization and classification

  • Yunsong Guan
  • Sikun Li
  • Bowen Sun
  • Jibin He
  • Jianlang Li
Open at sourceDOICite

Related

  1. Deep diffractive optical neural networks for detecting skyrmionic topologies of light and their live training
    Hadrian Bezuidenhout, Cade Peters, Ram Nandan Kumar +2
    Nature CommunicationsPeer-reviewedCC BY-NC-ND 4.0Full textOptics & photonicsCrossref
  2. Restricted Modulation Freedom Enhances Noise Robustness in Coherent Diffractive Optical Networks
    Hyuntae Lim, Kyoungsik Kim
    arXivPreprintCC BY 4.0Full textApplied physics & instrumentationOptics & photonicsarXiv
  3. Quantization-Aware Nonlinear Diffractive Neural Network for Robust Optical Image Reconstruction under Fabrication Constraints
    Junyu Wang, Jie Lu, Haoyu Li +11
    Optics ExpressPeer-reviewedLicence not statedOptics & photonicsCrossref
  4. Cascaded Holographic-Diffractive Neural Network with Dual-Polarization Multiplexing for High-Security Optical Encryption
    Yi Guo, Shijie Zhang, Tingzhen Yan +11
    Optics ExpressPeer-reviewedLicence not statedOptics & photonicsCrossref
  5. Beyond the Thin-Layer Limit: Differentiable Volumetric Training for Visible-Range Diffractive Neural Networks
    Dushan Wadduwage, Dineth Jayakody
    Optics ExpressPeer-reviewedLicence not statedOptics & photonicsCrossref

Cite

BibTeXRIS
BibTeX
@article{guan2026diffractive,
  title = {{Diffractive optical-digital neural networks for robust EUV mask phase-defect characterization and classification}},
  author = {Yunsong Guan and Sikun Li and Bowen Sun and Jibin He and Jianlang Li},
  journal = {Optics Express},
  year = {2026},
  month = nov,
  doi = {10.1364/oe.612390},
  url = {https://opg.optica.org/oe/abstract.cfm?doi=10.1364/OE.612390},
}
RIS
TY  - JOUR
TI  - Diffractive optical-digital neural networks for robust EUV mask phase-defect characterization and classification
AU  - Yunsong Guan
AU  - Sikun Li
AU  - Bowen Sun
AU  - Jibin He
AU  - Jianlang Li
PY  - 2026
DA  - 2026/11/08
JO  - Optics Express
DO  - 10.1364/oe.612390
UR  - https://opg.optica.org/oe/abstract.cfm?doi=10.1364/OE.612390
SN  - 1094-4087
ER  -