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PreprintCC BY 4.0arXiv

Predicting electric-field noise in ion traps using fluctuation electrodynamics

  • Markus Teller
  • Da An
  • Alberto M. Alonso
  • Philip C. Holz
  • Philipp Schindler
  • Hartmut Häffner
  • Tracy E. Northup
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Abstract

Electric-field noise in microfabricated surface ion traps contributes to gate errors in trapped-ion quantum computers, but this noise has been challenging to predict. Here, we present a method to predict the electric-field noise arising from fluctuations in the bulk of dielectric and metallic materials. The method is valid for arbitrary trap geometries, and the only relevant material property is energy loss. We apply it to an ion trap with an electrically floating electrode and find the contribution from dielectrics to be dominant. Our model predicts the observed noise for this trap within a factor of four. In addition, we apply our model to typical surface trap designs and analyze how the electrode structures shield the noise.

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Cite

BibTeXRIS
BibTeX
@misc{teller2026predicting,
  title = {{Predicting electric-field noise in ion traps using fluctuation electrodynamics}},
  author = {Markus Teller and Da An and Alberto M. Alonso and Philip C. Holz and Philipp Schindler and Hartmut Häffner and Tracy E. Northup},
  howpublished = {arXiv},
  year = {2026},
  month = oct,
  doi = {10.48550/arxiv.2610.01693},
  eprint = {2610.01693},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2610.01693},
  note = {CC BY 4.0},
}
RIS
TY  - UNPB
TI  - Predicting electric-field noise in ion traps using fluctuation electrodynamics
AU  - Markus Teller
AU  - Da An
AU  - Alberto M. Alonso
AU  - Philip C. Holz
AU  - Philipp Schindler
AU  - Hartmut Häffner
AU  - Tracy E. Northup
PY  - 2026
DA  - 2026/10/01
PB  - arXiv
DO  - 10.48550/arxiv.2610.01693
UR  - https://arxiv.org/abs/2610.01693
AB  - Electric-field noise in microfabricated surface ion traps contributes to gate errors in trapped-ion quantum computers, but this noise has been challenging to predict. Here, we present a method to predict the electric-field noise arising from fluctuations in the bulk of dielectric and metallic materials. The method is valid for arbitrary trap geometries, and the only relevant material property is energy loss. We apply it to an ion trap with an electrically floating electrode and find the contribution from dielectrics to be dominant. Our model predicts the observed noise for this trap within a factor of four. In addition, we apply our model to typical surface trap designs and analyze how the electrode structures shield the noise.
ER  -