Peer-reviewedCC BY-NC-ND 4.0Scientific Reports
Enhanced discrepancy-aware visual inspection with a single global threshold for industrial assembly
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BibTeX
@article{lin2026enhanced,
title = {{Enhanced discrepancy-aware visual inspection with a single global threshold for industrial assembly}},
author = {En-Yu Lin and Jenn-Jier James Lien},
journal = {Scientific Reports},
year = {2026},
month = oct,
doi = {10.1038/s41598-026-72116-7},
url = {https://www.nature.com/articles/s41598-026-72116-7},
note = {CC BY-NC-ND 4.0},
}
RIS
TY - JOUR
TI - Enhanced discrepancy-aware visual inspection with a single global threshold for industrial assembly
AU - En-Yu Lin
AU - Jenn-Jier James Lien
PY - 2026
DA - 2026/10/03
JO - Scientific Reports
DO - 10.1038/s41598-026-72116-7
UR - https://www.nature.com/articles/s41598-026-72116-7
SN - 2045-2322
ER -