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PreprintCC BY 4.0HAL

Hierarchical clustering of X-Ray Fluorescence images using a dissimilarity based on the likelihood ratio statistic

Abstract

The study of ancient materials is marked by their heterogeneity, uniqueness, and poor prior knowledge. Their analysis must be extensive, non-destructive, and precise. For these reasons, X-Ray Fluorescence (XRF) imaging is widely used for elemental analysis. X-Rays exposure time must balance extensiveness and sample preservation, a trade-off highly dependent on data exploitation: sufficient data must be collected for relevance without damaging the sample.

To address this, this article extends the work of Celeux et al. ( 2022) on spatially constrained hierarchical clustering of spectral images. It focuses on the probabilistic model characterizing XRF, deriving a dissimilarity and an associated cost function for comparing spectra. Tested within the aforementioned algorithm, it improves segmentation robustness to noise and relevance over the previously used χ 2 distance. Our results suggest equivalent material characterisation could be achieved with reduced exposure time, minimizing damage and enabling the collection of larger images.

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BibTeX
@misc{megel2026hierarchical,
  title = {{Hierarchical clustering of X-Ray Fluorescence images using a dissimilarity based on the likelihood ratio statistic}},
  author = {Maxime Megel and Gilles Celeux and Serge X. Cohen and Agnes Grimaud and Clara Hairie and Christine Keribin},
  howpublished = {HAL},
  year = {2026},
  month = oct,
  url = {https://hal.science/hal-05799747v2},
  note = {CC BY 4.0},
}
RIS
TY  - UNPB
TI  - Hierarchical clustering of X-Ray Fluorescence images using a dissimilarity based on the likelihood ratio statistic
AU  - Maxime Megel
AU  - Gilles Celeux
AU  - Serge X. Cohen
AU  - Agnes Grimaud
AU  - Clara Hairie
AU  - Christine Keribin
PY  - 2026
DA  - 2026/10/14
PB  - HAL
UR  - https://hal.science/hal-05799747v2
AB  - The study of ancient materials is marked by their heterogeneity, uniqueness, and poor prior knowledge. Their analysis must be extensive, non-destructive, and precise. For these reasons, X-Ray Fluorescence (XRF) imaging is widely used for elemental analysis. X-Rays exposure time must balance extensiveness and sample preservation, a trade-off highly dependent on data exploitation: sufficient data must be collected for relevance without damaging the sample.  To address this, this article extends the work of Celeux et al. ( 2022) on spatially constrained hierarchical clustering of spectral images. It focuses on the probabilistic model characterizing XRF, deriving a dissimilarity and an associated cost function for comparing spectra. Tested within the aforementioned algorithm, it improves segmentation robustness to noise and relevance over the previously used χ 2 distance. Our results suggest equivalent material characterisation could be achieved with reduced exposure time, minimizing damage and enabling the collection of larger images.
ER  -