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Ortho-symplectic interface line operators in ๐ฉ=4 SYM theories
Abstract
We study the line operators at the half-BPS interfaces in 4d ๐ฉ=4 super Yang-Mills (SYM) theories of orthogonal and symplectic gauge groups. For the NS5-type interfaces, line operators are labeled by pairs of electric or magnetic charges under the gauge groups on either side of the interface, whereas for the D5-type interfaces they are labeled by electric or magnetic charges under the single gauge group preserved by the interface. We propose dualities between the Wilson lines and vortex lines at the interfaces under the action of S-duality. As highly non-trivial evidence of the dualities on the junctions of the line operators and the interfaces, we find matching of the line defect half-indices for the dual pairs.
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BibTeX
@misc{hatsuda2026orthosymplectic,
title = {{Ortho-symplectic interface line operators in $\mathcalN=4$ SYM theories}},
author = {Yasuyuki Hatsuda and Tadashi Okazaki},
howpublished = {arXiv},
year = {2026},
month = oct,
doi = {10.48550/arxiv.2610.39207},
eprint = {2610.39207},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2610.39207},
}
RIS
TY - UNPB
TI - Ortho-symplectic interface line operators in ๐ฉ=4 SYM theories
AU - Yasuyuki Hatsuda
AU - Tadashi Okazaki
PY - 2026
DA - 2026/10/29
PB - arXiv
DO - 10.48550/arxiv.2610.39207
UR - https://arxiv.org/abs/2610.39207
AB - We study the line operators at the half-BPS interfaces in 4d ๐ฉ=4 super Yang-Mills (SYM) theories of orthogonal and symplectic gauge groups. For the NS5-type interfaces, line operators are labeled by pairs of electric or magnetic charges under the gauge groups on either side of the interface, whereas for the D5-type interfaces they are labeled by electric or magnetic charges under the single gauge group preserved by the interface. We propose dualities between the Wilson lines and vortex lines at the interfaces under the action of S-duality. As highly non-trivial evidence of the dualities on the junctions of the line operators and the interfaces, we find matching of the line defect half-indices for the dual pairs.
ER -