Quantum annealing of the random transverse-field Ising model in one, two, and three dimensions
Abstract
Quantum annealing must be sufficiently slow to prevent defect formation. We study this problem in the random transverse-field Ising model via the adiabatic theorem to obtain the limiting rate at which defect formation can be avoided. Our approach based on the strong-disorder renormalization group (SDRG) technique views the annealing process as a gradual aggregation of strongly coupled clusters, giving access to the elementary events of error formation. We present a scaling theory of the statistics of these events in general dimensions and confront it to an extensive numerical analysis carried out in one, two, and three dimensions by an efficient implementation of the SDRG method. This approach is also validated by exact diagonalization in one dimension by means of the free-fermion technique. Our results consistently show a logarithmically slow decrease of the error density with the annealing time, characterized by the dimension-dependent critical exponents of the corresponding infinite-disorder fixed point of the model. Furthermore, we provide a map of individual events of potential defect formation in the excitation energy - control parameter plane, which may help in the design of optimal annealing paths.
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BibTeX
@misc{kovacs2026quantum,
title = {{Quantum annealing of the random transverse-field Ising model in one, two, and three dimensions}},
author = {István A. Kovács and Neil Shah and Róbert Juhász},
howpublished = {arXiv},
year = {2026},
month = oct,
doi = {10.48550/arxiv.2610.11411},
eprint = {2610.11411},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2610.11411},
}
RIS
TY - UNPB
TI - Quantum annealing of the random transverse-field Ising model in one, two, and three dimensions
AU - István A. Kovács
AU - Neil Shah
AU - Róbert Juhász
PY - 2026
DA - 2026/10/08
PB - arXiv
DO - 10.48550/arxiv.2610.11411
UR - https://arxiv.org/abs/2610.11411
AB - Quantum annealing must be sufficiently slow to prevent defect formation. We study this problem in the random transverse-field Ising model via the adiabatic theorem to obtain the limiting rate at which defect formation can be avoided. Our approach based on the strong-disorder renormalization group (SDRG) technique views the annealing process as a gradual aggregation of strongly coupled clusters, giving access to the elementary events of error formation. We present a scaling theory of the statistics of these events in general dimensions and confront it to an extensive numerical analysis carried out in one, two, and three dimensions by an efficient implementation of the SDRG method. This approach is also validated by exact diagonalization in one dimension by means of the free-fermion technique. Our results consistently show a logarithmically slow decrease of the error density with the annealing time, characterized by the dimension-dependent critical exponents of the corresponding infinite-disorder fixed point of the model. Furthermore, we provide a map of individual events of potential defect formation in the excitation energy - control parameter plane, which may help in the design of optimal annealing paths.
ER -