Time performance of USTC-IME LGAD under synchrotron light source focused X-ray
Abstract
The time performance of Low Gain Avalanche Diodes (LGADs), designed by the University of Science and Technology of China (USTC) and fabricated by the Institute of Microelectronics of Chinese Academy of Sciences (IME), was characterized at the Shanghai Synchrotron Radiation Facility (SSRF). The experiment was conducted at the BL16B1 beamline, which delivers a focused X-ray beam with a diameter of 500 \textmu\text{m}, a repetition period of 2 ns, and a photon energy of 10 keV. Using a fast oscilloscope, waveforms containing continuous signal pulses were recorded within a 50 ns time window. The LGAD under test successfully resolved the 2 ns period of the SSRF. To mitigate pile-up effects and extract pulse-by-pulse information from the acquired waveforms, a waveform-level global template fitting method was employed. The time resolution was then estimated using a combined profile likelihood approach, with a restricted maximum-likelihood (REML) correction accounting for the per-waveform degrees of freedom, yielding a value of 136.8 ± 0.15 (stat.) ± 11.9 (syst.) ps. The complete reconstruction and fitting chain was validated end-to-end using simulated waveforms in which the timing deviations of individual large pulses were drawn from Gaussian distributions with fixed standard deviations. The effect of random photon absorption depth on the time resolution of LGADs was studied through dedicated simulations.
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BibTeX
@misc{wang2026time,
title = {{Time performance of USTC-IME LGAD under synchrotron light source focused X-ray}},
author = {Tianao Wang and De Zhang and Zheng Liang and Chaozhi Li and Jiaqi Luo and Yu Nie and Tianshuo Yue and Zebo Tang and Hao Liang and Tongpu Yu and Wanbing He and Yanwen Liu},
howpublished = {arXiv},
year = {2026},
month = oct,
doi = {10.48550/arxiv.2609.00972},
eprint = {2609.00972},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2609.00972},
note = {CC BY-SA 4.0},
}
RIS
TY - UNPB
TI - Time performance of USTC-IME LGAD under synchrotron light source focused X-ray
AU - Tianao Wang
AU - De Zhang
AU - Zheng Liang
AU - Chaozhi Li
AU - Jiaqi Luo
AU - Yu Nie
AU - Tianshuo Yue
AU - Zebo Tang
AU - Hao Liang
AU - Tongpu Yu
AU - Wanbing He
AU - Yanwen Liu
PY - 2026
DA - 2026/10/19
PB - arXiv
DO - 10.48550/arxiv.2609.00972
UR - https://arxiv.org/abs/2609.00972
AB - The time performance of Low Gain Avalanche Diodes (LGADs), designed by the University of Science and Technology of China (USTC) and fabricated by the Institute of Microelectronics of Chinese Academy of Sciences (IME), was characterized at the Shanghai Synchrotron Radiation Facility (SSRF). The experiment was conducted at the BL16B1 beamline, which delivers a focused X-ray beam with a diameter of 500 \textmu\text{m}, a repetition period of 2 ns, and a photon energy of 10 keV. Using a fast oscilloscope, waveforms containing continuous signal pulses were recorded within a 50 ns time window. The LGAD under test successfully resolved the 2 ns period of the SSRF. To mitigate pile-up effects and extract pulse-by-pulse information from the acquired waveforms, a waveform-level global template fitting method was employed. The time resolution was then estimated using a combined profile likelihood approach, with a restricted maximum-likelihood (REML) correction accounting for the per-waveform degrees of freedom, yielding a value of 136.8 ± 0.15 (stat.) ± 11.9 (syst.) ps. The complete reconstruction and fitting chain was validated end-to-end using simulated waveforms in which the timing deviations of individual large pulses were drawn from Gaussian distributions with fixed standard deviations. The effect of random photon absorption depth on the time resolution of LGADs was studied through dedicated simulations.
ER -