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PreprintarXiv licencearXiv

Imaging defects in two-dimensional crystals by convergent beam electron diffraction

  • Tatiana Latychevskaia
  • Pengru Huang
  • Kostya S. Novoselov
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Abstract

Convergent beam electron diffraction (CBED), recently demonstrated on two-dimensional (2D) materials, offers a number of interesting applications such as imaging atomic in- and out-of plane shifts, interlayer distances, and individual adsorbates. In this study, we show how CBED allows for atomic-precision imaging of individual defects in 2D materials using one single-shot intensity measurement. In combination with structural calculations using density functional theory, we present simulated CBED patterns for various defects in graphene, each of which exhibits a unique fingerprint distribution. We also show how atomic positions, including the individual atomic defects in graphene, can be reconstructed by iterative phase retrieval from a single CBED pattern.

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Cite

BibTeXRIS
BibTeX
@misc{latychevskaia2026imaging,
  title = {{Imaging defects in two-dimensional crystals by convergent beam electron diffraction}},
  author = {Tatiana Latychevskaia and Pengru Huang and Kostya S. Novoselov},
  howpublished = {arXiv},
  year = {2026},
  month = oct,
  doi = {10.48550/arxiv.2610.21542},
  eprint = {2610.21542},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2610.21542},
}
RIS
TY  - UNPB
TI  - Imaging defects in two-dimensional crystals by convergent beam electron diffraction
AU  - Tatiana Latychevskaia
AU  - Pengru Huang
AU  - Kostya S. Novoselov
PY  - 2026
DA  - 2026/10/15
PB  - arXiv
DO  - 10.48550/arxiv.2610.21542
UR  - https://arxiv.org/abs/2610.21542
AB  - Convergent beam electron diffraction (CBED), recently demonstrated on two-dimensional (2D) materials, offers a number of interesting applications such as imaging atomic in- and out-of plane shifts, interlayer distances, and individual adsorbates. In this study, we show how CBED allows for atomic-precision imaging of individual defects in 2D materials using one single-shot intensity measurement. In combination with structural calculations using density functional theory, we present simulated CBED patterns for various defects in graphene, each of which exhibits a unique fingerprint distribution. We also show how atomic positions, including the individual atomic defects in graphene, can be reconstructed by iterative phase retrieval from a single CBED pattern.
ER  -